Patent US5393375A successfully refreshed from Google Patents.
← Back to Patent Explorer
US5393375A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for fabricating submicron single crystal electromechanical structures

Assignee: Cornell Research Foundation Inc
•
Filing: 1993-12-22
•
Granted: 1995-02-28
•
Expires: 2013-12-22
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A process for fabricating submicron movable mechanical structures utilizes chemically assisted ion beam etching and reactive ion etching which are independent of crystal orientation. The process provides released mechanical structures which may be of the same material or of different materials than the surrounding substrate, and a nitride coating may be provided on the released structure for optical applications.

Inventors

  • 👤 Noel C. MacDonald
  • 👤 Zhoying L. Zhang
  • 👤 Gyorgy A. Porkolab

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 05:26
CPC Classifications
B; B81; B81C; B81C1/00; B81C1/00436; B81C1/00523; B81C1/00531; B82; B82Y; B82Y15/00; Y; Y10; Y10S; Y10S148/00; Y10S148/135

Claims Analysis

Total Claims: 19
Claim 1
Independent Claim 190 words
A process for fabricating, from a single crystal substrate, a high aspect ratio, released, single-crystal microstructure having any arbitrary structural orientation with respect to the substrate, comprising: providing a substrate of single-crystal material from which a microstructure is to be fabricated; depositing by plasma enhanced chemical vapor deposition of silicon nitride a first layer of a dielectric stack on a top surface of said substrate; depositing by plasma enhanced chemical vapor deposition of silicon dioxide a second layer of said dielectric stack on a top surface of said first layer; forming in said dielectric stack a pattern of the microstructure to be fabricated; transferring said pattern to said substrate by ion beam etching to form trenches having bottom walls and vertical side walls in the substrate, the trenches defining mesas having the location, shape and dimensions of the microstructure; conformally coating said substrate with a dielectric material to form a third layer on said second layer, on said trench bottom walls, and on said vertical side walls; etching back said third layer from the bottom walls of said trenches; and releasing said mesas to produce said microstructure from said substrate.
Claim 2
Dependent Claim 190 words
A process for fabricating, from a single crystal substrate, a high aspect ratio, released, single-crystal microstructure having any arbitrary structural orientation with respect to the substrate, comprising: providing a substrate of single-crystal material from which a microstructure is to be fabricated; depositing by plasma enhanced chemical vapor deposition of silicon nitride a first layer of a dielectric stack on a top surface of said substrate; depositing by plasma enhanced chemical vapor deposition of silicon dioxide a second layer of said dielectric stack on a top surface of said first layer; forming in said dielectric stack a pattern of the microstructure to be fabricated; transferring said pattern to said substrate by ion beam etching to form trenches having bottom walls and vertical side walls in the substrate, the trenches defining mesas having the location, shape and dimensions of the microstructure; conformally coating said substrate with a dielectric material to form a third layer on said second layer, on said trench bottom walls, and on said vertical side walls; etching back said third layer from the bottom walls of said trenches; and releasing said mesas to produce said microstructure from said substrate.
Claim 3
Dependent Claim 20 words
The process of claim 1, further including applying a conformed layer of dielectric material to completely cover said released microstructure.
Claim 4
Dependent Claim 21 words
The process of claim 1, further including the step of metallizing selected regions of said microstructure and said substrate vertical walls.
Claim 5
Dependent Claim 19 words
The process of claim 1, further including forming a membrane over said released microstructure to provide a movable membrane.
Claim 6
Dependent Claim 22 words
The process of claim 1, wherein the step of transferring said pattern by ion beam etching includes chemically reactive ion beam etching.
Claim 7
Dependent Claim 21 words
The process of claim 1, wherein the step of transferring said pattern by ion beam etching includes reactive ion beam etching.
Claim 8
Dependent Claim 30 words
The process of claim 1, wherein the step of providing a substrate comprises selecting a single crystal material from the group consisting of gallium arsenide, silicon germanium, and indium phosphide.
Claim 9
Dependent Claim 23 words
The process of claim 1, wherein the step of providing a substrate comprises selecting a graded index, separate confinement herterostructure quantum well material.
Claim 10
Dependent Claim 34 words
The process of claim 1, wherein the step of depositing said first layer on said top surface of said substrate comprises depositing a layer having a thermal expansion matching that of said substrate material.
Claim 11
Dependent Claim 49 words
The process of claim 1, wherein the step of forming a pattern in said dielectric stack includes depositing a photoresist on said second layer, optically producing a mask pattern in said photoresist, and transferring said mask pattern by reactive ion etching to the dielectric stack through the mask pattern.
Claim 12
Dependent Claim 41 words
The process of claim 10, wherein the step of transferring said pattern to said substrate by ion beam etching includes forming trenches having smooth, vertical side walls to a depth of about 10 μm and smooth bottom walls in said trenches.
Claim 13
Dependent Claim 67 words
The process of claim 11, further including, after the step of forming said third layer, metallizing selected regions of said microstructure by depositing on said third layer a conformal layer of metal, masking said metal layer, and removing unmasked metal, thereby providing selected metallized regions and selected regions not coveted by said metal layer, said metal layer being removed at least from the bottoms of said trenches.
Claim 14
Dependent Claim 43 words
The process of claim 12, wherein the step of metallizing is preceded by masking, patterning and etching said third dielectric layer to provided selected contact windows therein to expose the substrate and to allow said metal to contact said substrate at selected locations.
Claim 15
Dependent Claim 88 words
The process of claim 13, wherein the step of etching back said third layer includes etching said third layer in regions not covered by said metal layer, including the bottom walls of said trenches, while leaving said third layer in place on at least parts of the side walls of said trenches, and thereafter etching the substrate at the bottoms of the trenches, deepening the trenches and laterally undercutting the mesas formed in the substrate to isolate top portions of the mesas to thereby produce said released microstructure.
Claim 16
Dependent Claim 20 words
The process of claim 14, further including applying a conformal layer of dielectric material to completely cover said released microstructure.
Claim 17
Dependent Claim 18 words
The process of claim 15, wherein the step of providing a substrate comprises selecting a gallium arsenide material.
Claim 18
Dependent Claim 45 words
The process of claim 1, wherein the step of forming a pattern includes defining a grid of mesas to be released, and further including the step of depositing a continuous membrane on top surfaces of said mesas, the membrane spanning said trenches between adjacent mesas.
Claim 19
Dependent Claim 17 words
The process of claim 1, wherein the step of forming a third dielectric layer includes depositing nitride.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-02-27 1998-08-29 1999-02-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-02-27 2002-08-29 2003-02-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-02-27 2006-08-29 2007-02-28 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag