Process for the production of a piezoresistive gauge and to an accelerometer incorporating such a gauge

Claim 2

A process for the production of a piezoresistive gauge on a lateral face of a beam formed by etching a substrate perpendicular to its surface and having an end which can move laterally in a first recess defined in the substrate comprising the stages of etching the substrate perpendicular to its surface for forming a second recess communicating with the first, the communication zone representing the image of the gauge to be produced, placing on the substrate surface a mechanical mask having an opening facing the second recess and partly extended over the upper face of the beam, passing through said opening a particle beam able to form a piezoresistive layer constituting the gauge and electric contacts, said beam being oriented obliquely with respect to the substrate surface, elimination of the mask and producing electrical conductors on the upper and lower faces of the beam with a view to supplying the gauge with electric current.

Claim 3

A production process according to claim 1, wherein the piezoresistive layer is formed from a piezoresistive material deposited by vacuum evaporation.

Claim 4

A production process according to claim 2, wherein the piezoresistive material is gold-doped polycrystalline germanium.

Claim 5

A production process according to claim 1, wherein the piezoresistive layer is formed by implanting ions in the substrate, the latter being of silicon.

Claim 6

A production process according to claim 1, wherein the electrical conductors are produced before the piezoresistive gauge.

Claim 7

A production process according to claim 1, wherein the electrical conductors are produced after the piezoresistive gauge by vacuum evaporation.

Claim 8

A process for producing an accelerometer with a piezoresistive gauge, having a beam, whereof one end can move laterally in a first recess formed in a substrate, the piezoresistive gauge, produced on a lateral face of the beam being used for measuring the displacement of said beam, wherein the proces comprises etching the substrate perpendicular to its surface in order to simultaneously form the first recess and a second recess communicating with the first recess, the communication zone representing the image of the gauge to be produced, placing on the surface of the substrate a mechanical mask provided with an opening facing the second recess and partly extending over the upper face of the beam, passing through the said opening a particle beam able to form a piezoresistive layer constituting the gauge and electric contacts, said beam being oriented obliquely with respect to the substrate surface, elimination of the mask and production of electrical conductors on upper and lower faces of the beam in order to supply the gauge with electric power.

Claim 9

A process for producing an accelerometer with a piezoresistive gauge, having a beam, whereof one end can move laterally in a first recess formed in a substrate, the piezoresistive gauge, produced on a lateral face of the beam being used for measuring the displacement of said beam, wherein the proces comprises etching the substrate perpendicular to its surface in order to simultaneously form the first recess and a second recess communicating with the first recess, the communication zone representing the image of the gauge to be produced, placing on the surface of the substrate a mechanical mask provided with an opening facing the second recess and partly extending over the upper face of the beam, passing through the said opening a particle beam able to form a piezoresistive layer constituting the gauge and electric contacts, said beam being oriented obliquely with respect to the substrate surface, elimination of the mask and production of electrical conductors on upper and lower faces of the beam in order to supply the gauge with electric power.

Claim 10

A production process according to claim 7, wherein it comprises the stages of depositing two conductive layers respectively on the upper and lower faces of the substrate, in which will be produced the electrical conductors for supplying power to the gauge, first etching of the two conductive layers in order to form a first etching mask of the substrate representing the image of the first and second recesses, etching the substrate perpendicular to its upper and lower surfaces to form recesses using the first mask, second etching of the conductive layers in order to form the electrical conductors, placing the mechanical mask on the upper surface of the substrate, passing the particle beam through the mechanical mask opening and eliminating the mechanical mask.

Claim 11

A production process according to claim 7, wherein the first and second recesses are formed by anisotropic chemical etching of the substrate.