Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
161 words
A method of making a mask comprising applying at least one metallic layer on the front of a semiconductor substrate, etching a mask in said metallic layer, etching the semiconductor surface exposed in the etched metallic layer to a predetermined depth, and etching tub-shaped recesses from the back of said semiconductor substrate to such a depth that the holes etched into the semiconductor front also open toward the wafer back, prior to the application of said metal layer said semiconductor substrate is doped from the wafer front down to a predetermined depth to produce a surface layer, said doping differing from the remaining substrate, applying an oxide layer onto the top of said metal layer, etching apertures with vertical walls in the shape of said mask pattern in said oxide layer to expose said metal layer, etching through the metal layer and then into the semiconductor substrate deeper than the thickness of the doped surface layer and underetching the metal layer.
Claim 2
Independent Claim
161 words
A method of making a mask comprising applying at least one metallic layer on the front of a semiconductor substrate, etching a mask in said metallic layer, etching the semiconductor surface exposed in the etched metallic layer to a predetermined depth, and etching tub-shaped recesses from the back of said semiconductor substrate to such a depth that the holes etched into the semiconductor front also open toward the wafer back, prior to the application of said metal layer said semiconductor substrate is doped from the wafer front down to a predetermined depth to produce a surface layer, said doping differing from the remaining substrate, applying an oxide layer onto the top of said metal layer, etching apertures with vertical walls in the shape of said mask pattern in said oxide layer to expose said metal layer, etching through the metal layer and then into the semiconductor substrate deeper than the thickness of the doped surface layer and underetching the metal layer.
Claim 3
Dependent Claim
26 words
A method in accordance with claim 1 wherein said surface layer is doped by the diffusion of an impurity or by implanting ions of the impurity.
Claim 4
Dependent Claim
18 words
A method as claimed in claim 1 wherein a thin monocrystalline semiconductor wafer is used as said substrate.
Claim 5
Dependent Claim
20 words
A method as claimed in claim 1 wherein said oxide layer is generated pyrolytically or by means of cathode sputtering.
Claim 6
Dependent Claim
33 words
A method as claimed in claim 1 wherein said oxide layer is selectively removed by means of reactive ion etching in an atmosphere containing CHF 3 or a CF 4 /H 2 -mixture.
Claim 7
Dependent Claim
34 words
A method as claimed in claim 1 wherein said metal layer is selectively removed by means of ion etching in an argon atmosphere using the hole pattern in the oxide layer as a mask.
Claim 8
Independent Claim
54 words
A method as claimed in claims 1 or 2 wherein said doped surface layer is selectively removed by means of reactive ion etching in an atmosphere containing argon and chlorine, setting an etch rate ratio of SiO 2 :Si of up to 1:10, the hole pattern in the oxide layer serving as a mask.
Claim 9
Dependent Claim
19 words
A method as claimed in claim 1 wherein a second metallic layer is applied after said apertures are etched.
Claim 10
Dependent Claim
25 words
A method as claimed in claim 1 wherein said metal layer is underetched by means of plasma etching in an atmosphere containing CF 4 .
Claim 11
Dependent Claim
28 words
A method as claimed in claim 1 wherein said metal layer is underetched by means of a dry etching process using fluorine (F 2 ) as an etchant.
Claim 12
Dependent Claim
30 words
A method as claimed in claim 1 wherein a solution containing ethylenediamine, pyrocathechol and water is used for underetching of said metal layer and said etching of said tub-shaped recesses.
Claim 13
Dependent Claim
37 words
A method as claimed in claim 1 wherein after the complete removal of said oxide layer, the metal layer is reinforced to such an extent that electrons with predetermined energy used for irradiation are fully absorbed therein.