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US4044371A Expired / Lapsed US ⏱️ 0.0 years remaining

Plurality of precise temperature resistors formed in monolithic integrated circuits

Assignee: Honeywell Inc
•
Filing: 1976-09-29
•
Granted: 1977-08-23
•
Expires: 1996-09-29
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Abstract

Abstract A precision sensistor structure is disclosed for use in a monolithic integrated circuit.

Inventors

  • 👤 Mona M. Abdelrahman
  • 👤 James M. Daughton

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-22 18:43
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/201; H10D84/204; H10D84/209; H10N; H10N19/00; Y; Y10; Y10S; Y10S148/00; Y10S148/136

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 216 words
A monolithic integrated circuit sensistor provided in a semiconductor material of a selected total resistance having a selected temperature coefficient of resistance and having a voltage coefficient of resistance which is less than a selected value, said sensistor comprising: a set of n isolated regions in said semiconductor material, each of a first conductivity type; a set of n resistor regions, each of a second conductivity type which is determined by ions implanted therein in a selected dose to provide said temperature coefficient of resistance, each of said resistor regions being located in a corresponding one of said isolated regions with a semiconductor junction occurring between each said resistor region and its corresponding isolated region and each of said resistor regions having a first end and a second end; and an interconnection network means electrically connecting each of said resistor regions in series with one another at said first and second ends in a resistor string and further adapted to electrically connect said resistor string into a circuit, said interconnection network means directly electrically connecting said first end of each said resistor region to its corresponding isolated region, a value for n being selected of two or more to be sufficiently large to reduce said voltage coefficient of resistance to being less than said selected value.
Claim 2
Dependent Claim 216 words
A monolithic integrated circuit sensistor provided in a semiconductor material of a selected total resistance having a selected temperature coefficient of resistance and having a voltage coefficient of resistance which is less than a selected value, said sensistor comprising: a set of n isolated regions in said semiconductor material, each of a first conductivity type; a set of n resistor regions, each of a second conductivity type which is determined by ions implanted therein in a selected dose to provide said temperature coefficient of resistance, each of said resistor regions being located in a corresponding one of said isolated regions with a semiconductor junction occurring between each said resistor region and its corresponding isolated region and each of said resistor regions having a first end and a second end; and an interconnection network means electrically connecting each of said resistor regions in series with one another at said first and second ends in a resistor string and further adapted to electrically connect said resistor string into a circuit, said interconnection network means directly electrically connecting said first end of each said resistor region to its corresponding isolated region, a value for n being selected of two or more to be sufficiently large to reduce said voltage coefficient of resistance to being less than said selected value.
Claim 3
Dependent Claim 46 words
The apparatus of claim 1 wherein said network interconnection means is of aluminim, said direct electrical contact in each of said isolated regions being made through a contact region therein of said first conductivity type but of a higher conductivity than that of said isolated regions.
Claim 4
Dependent Claim 30 words
The apparatus of claim 2 wherein each said resistor region has a resistance value between said first and second ends substantially equal to that of every other said resistor region.
Claim 5
Dependent Claim 39 words
The apparatus of claim 2 wherein each of said isolated regions has a buried layer region provided between it and a substrate on which said isolated regions are formed, said buried layer region being of said first conductivity type.
Claim 6
Dependent Claim 19 words
The apparatus of claim 4 wherein said isolated regions are formed in an epitaxial layer grown on said substrate.
Claim 7
Dependent Claim 46 words
The apparatus of claim 4 wherein said network interconnection means is of aluminum, said direct electrical contact in each of said isolated regions being made through a contact region therein of said first conductivity type but of a higher conductivity than that of said isolated regions.

References Cited (Backward Citations)

US3341754A Cited
US3491325A Cited
US3655457A Cited
US3683306A Cited
US3548269A Cited
US3947866A Cited
US3902926A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1980-08-22 1981-02-21 1981-08-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1984-08-22 1985-02-21 1985-08-23 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1988-08-22 1989-02-21 1989-08-23 $7700.00 Window Closed / Lapsed

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