Soft bond for semiconductor dies

Claim 2

Method for temporarily connecting a semiconductor circuit die to external equipment for testing purposes in order to generate reliability and test data concerning the die, whereby the die may be subsequently disconnected, characterized by: a) placing the die in a die carrier having a die receiving portion thereon, said die carrier having a plurality of connectors thereon for connection to test circuitry, and said die carrier having a plurality of bondpads in close proximity of the die receiving portion; b) attaching leadwires to the die at bondpads on the die and attaching the leadwires to the bondpads on the die carrier, said attachment of leadwires to the bondpads on the die being with sufficient bonding force to provide an electrical connection and to retain the leadwires on the bondpads on the die during a test sequence, and said bonding force being less than an attachment force of the bondpads on the die to the die and less than the tensile strength to separate the leadwires from the bondpads; c) providing signals to at least one of the bondpads on the die carrier in response to signals to at least one of the connectors, and providing signals to at least one of the connectors in response to signals which are present at least one of the bondpads; d) removing the leadwires from the bondpads on the die, resulting in the detachment of the leadwires to the bondpads on the die, wherein during said removal of the leadwires, bond attachment of the leadwires to the bondpads on the die is removed while the bondpads remain intact on the die; and e) removing the die from the die carrier.

Claim 3

Method as described in claim 1, further comprising: the step of placing the die in a die carrier including securing the die in the die carrier with a material having a property of exhibiting a charged surface state sufficient and coefficient of friction sufficient to hold the die in place without adhesive.

Claim 4

Method as described in claim 1, further comprising: the step of placing the die in a die carrier including securing the die in the die carrier with a silicone strip which exhibits a charged surface state sufficient to hold the die in place.

Claim 5

Method as described in claim 1, further comprising: the step of placing the die in a die carrier including securing the die in the die carrier by applying a liquid, and causing the liquid to be cured on the die carrier, the cured liquid exhibiting a charged surface state sufficient to hold the die in place.

Claim 6

Method as described in claim 1, further comprising: the step of placing the die in a die carrier including securing the die in the die carrier with a material which exhibits a charged surface state sufficient to hold the die in place within the die carrier during the attachment of the leadwires to the bondpads on the die.

Claim 7

Method as described in claim 5, further wherein: said material which exhibits a sufficient charged surface state being a silicone based polymer.

Claim 8

Method as described in claim 5, further comprising: placing a lid over the die carrier after the die has been placed in the die carrier, the lid providing a protective cover which prevents contaminants from entering the die cavity.

Claim 9

Method as described in claim 5, further comprising: a) placing a lid over the die carrier after the die has been placed in the die carrier, the lid securing the die from movement; and b) the lid further providing a protective cover which prevents contaminants from entering the die cavity.

Claim 10

Method as described in claim 1, further comprising: a) placing a lid over the die carrier after the die has been placed in the die carrier, the lid securing the die from movement; and b) the lid further including a material having a property of exhibiting a charged surface state, the charged surface state resulting in electrostatic attraction of free particles.

Claim 11

Method as described in claim 9, further wherein: said material which exhibits a sufficient charged surface state being a silicone based polymer.

Claim 12

Method as described in claim 9, further comprising: the step of placing the die in a die carrier including securing the die in the die carrier with a thermoplastic adhesive.

Claim 13

Method as described in claim 1, further comprising: placing a lid over the die carrier after the die has been placed in the die carrier, the lid securing the die from movement.

Claim 14

Method as described in claim 1, further comprising: said attachment of the leadwires to the die being accomplished by laser bonding.

Claim 15

Method as described in claim 1, further comprising: said attachment of the leadwires to the die being accomplished by applying thermosonic energy applied through an thermosonic wirebonder.

Claim 16

Method as described in claim 1, further comprising: said attachment of the leadwires to the die being accomplished by applying thermocompression energy applied through an thermocompression wirebonder.

Claim 17

Method as described in claim 1, further comprising: said attachment of the leadwires to the die being accomplished by applying ultrasonic energy applied through an ultrasonic wirebonder.

Claim 18

Method as described in claim 16, further comprising: said attachment of the leadwires to the die being effected with a bond strength which is less than one fourth the attachment strength of the bondpads to the die.

Claim 19

Method as described in claim 16, further comprising: said attachment of the leadwires to the die being effected with a bond strength which is less than half the attachment strength of the bondpads to the die.

Claim 20

Method as described in claim 16, further comprising: said attachment of the leadwires to the die being effected with a bond strength which is less than two thirds the attachment strength of the bondpads to the die.

Claim 21

Method as described in claim 16, further comprising: said attachment of the leadwires to the die being at a bond strength selected such that said removal of the leadwires results in at least 50% of conventionally usable bondpad area remaining substantially undisturbed on the die.

Claim 22

Method as described in claim 1, further comprising: said detachment of the leadwires to the die being accomplished by chemical dissolution of the leadwires.

Claim 23

Method as described in claim 1, further comprising: removing the leadwires from the die carrier, said detachment of the leadwires to the die being accomplished by chemical dissolution of the leadwires.

Claim 24

Method as described in claim 1, further comprising: said attachment of the leadwires to the die being accomplished by applying ultrasonic energy applied through an ultrasonic wirebonder to conductive metallic leadwire, whereby, the wirebonder is selected to provide a bond size which is less than 0.25× the bond size which is appropriate for a permanent wirebond for the die.

Claim 25

Method as described in claim 1, further comprising: said attachment of the leadwires to the die being accomplished by applying ultrasonic energy applied through an ultrasonic wirebonder to aluminum leadwire, whereby, the wirebonder is selected to provide a bond size which is less than 0.25× the bond size which is appropriate for a permanent wirebond for the die.

Claim 26

Method as described in claim 1, further comprising: said attachment of the leadwires to the die being accomplished by applying ultrasonic energy applied through an ultrasonic wirebonder, whereby, the wirebonder is selected to provide a bond size which is less than 0.1× the bond size which is appropriate for a permanent wirebond for the die.

Claim 27

Method as described in claim 1, further comprising: said detachment of the leadwires to the die being accomplished by applying a force of at least 0.1 grams and no greater than 4.0 grams so that said removal of the leadwires leaves the bondpad suitable for ordinary ohmic contact attachment.

Claim 28

Method as described in claim 1, further comprising: a) providing said die carrier with a hole in said die receiving portion; and b) applying force through said hole in order to assist said removal of the die from the die carrier.

Claim 29

Method for connecting a semiconductor circuit die to external equipment for testing purposes and testing the die, whereby the die may be subsequently disconnected, characterized by: a) providing a die carrier having a die receiving portion thereon, said die carrier having a plurality of connectors thereon for connection to test circuitry, and said die carrier having a plurality of bondpads in close proximity of the die receiving portion; b) applying a water soluble glass to the die receiving portion; c) placing the die in the die receiving portion; d) permitting the water soluble glass to bond to the die; e) attaching leadwires to the die at bondpads on the die and attaching the leadwires to the bondpads on the die carrier, said attachment of leadwires to the bondpads on the die being with sufficient bonding force to provide an electrical connection and to retain the leadwires on the bondpads on the die during a test sequence, and said bonding force being less than an attachment force of the bondpads on the die to the die and less than the tensile strength of the leadwires separate from the bondpads; f) providing signals to at least one of the bondpads on the die carrier in response to signals to at least one of the connectors, and providing signals to at least one of the connectors in response to signals at least one of the bondpads; g) removing the leadwires from the bondpads on the die, resulting in the detachment of the leadwires to the bondpads on the die, wherein during said removal of the leadwires, bond attachment of the leadwires to the bondpads on the die is removed while the leadwires remain unsevered and the bondpads remain intact; and h) dissolving the water soluble glass sufficiently to remove the die from the die carrier.

Claim 30

Method for connecting a semiconductor circuit die to external equipment for testing purposes and testing the die, whereby the die may be subsequently disconnected, characterized by: a) providing a die carrier having a die receiving portion thereon, said die carrier having a plurality of connectors thereon for connection to test circuitry, and said die carrier having a plurality of bondpads in close proximity of the die receiving portion; b) applying a water soluble glass to the die receiving portion; c) placing the die in the die receiving portion; d) permitting the water soluble glass to bond to the die; e) attaching leadwires to the die at bondpads on the die and attaching the leadwires to the bondpads on the die carrier, said attachment of leadwires to the bondpads on the die being with sufficient bonding force to provide an electrical connection and to retain the leadwires on the bondpads on the die during a test sequence, and said bonding force being less than an attachment force of the bondpads on the die to the die and less than the tensile strength of the leadwires separate from the bondpads; f) providing signals to at least one of the bondpads on the die carrier in response to signals to at least one of the connectors, and providing signals to at least one of the connectors in response to signals at least one of the bondpads; g) removing the leadwires from the bondpads on the die, resulting in the detachment of the leadwires to the bondpads on the die, wherein during said removal of the leadwires, bond attachment of the leadwires to the bondpads on the die is removed while the leadwires remain unsevered and the bondpads remain intact; and h) dissolving the water soluble glass sufficiently to remove the die from the die carrier.

Claim 31

Method as described in claim 28, further comprising: a) the water soluble glass being water soluble hot melt glass, and further being a thermoplastic material which melts at sufficiently low temperature to avoid damage to the die; b) the dissolving of the water soluble glass being accomplished by placing the die carrier in water, which causes the glass to dissolve, thereby freeing the die; and c) reusing the die carrier.