Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
280 words
A process for the production of a planar monolithic integrated optical device incorporating at least one semiconductor laser and an optical waveguide by stacking semiconductor layers by epitaxy on a substrate, wherein it comprises the following operations: the substrate is given a profile having at least one step of height (h) between two different height levels, namely a lower level and an upper level; on said substrate is deposited by a single vapour phase epixtaxy operation and in a successive manner a first confinement layer, a guidance layer made from a material transparent for the radiation emitted by the laser, a second confinement layer, an active layer, a third confinement layer and a contact layer, to form a lower stack on said lower level and an upper stack on said upper level; the transparent material is chosen in such a way that its refractive index is higher than the indices of the confinement layers surrounding it; thickness values are given to the transparent guidance layer, the second confinement layer and the active layer such that the distance (d) separating the median planes of the active layer and the transparent guidance layer is equal to the height (h) of the substrate step, thereby the active layer of the lower stack is located at the same level as the transparent guidance layer of the upper stack, the lower stack constituting a laser emitting radiation in the plane of the active layer, said radiation penetrating into and being guided by the transparent guidance layer of the upper stack serving as an optical guide; etching said third confinement layer and said contact layer of the upper stack, thereby leading to a planar upper face.
Claim 2
Dependent Claim
280 words
A process for the production of a planar monolithic integrated optical device incorporating at least one semiconductor laser and an optical waveguide by stacking semiconductor layers by epitaxy on a substrate, wherein it comprises the following operations: the substrate is given a profile having at least one step of height (h) between two different height levels, namely a lower level and an upper level; on said substrate is deposited by a single vapour phase epixtaxy operation and in a successive manner a first confinement layer, a guidance layer made from a material transparent for the radiation emitted by the laser, a second confinement layer, an active layer, a third confinement layer and a contact layer, to form a lower stack on said lower level and an upper stack on said upper level; the transparent material is chosen in such a way that its refractive index is higher than the indices of the confinement layers surrounding it; thickness values are given to the transparent guidance layer, the second confinement layer and the active layer such that the distance (d) separating the median planes of the active layer and the transparent guidance layer is equal to the height (h) of the substrate step, thereby the active layer of the lower stack is located at the same level as the transparent guidance layer of the upper stack, the lower stack constituting a laser emitting radiation in the plane of the active layer, said radiation penetrating into and being guided by the transparent guidance layer of the upper stack serving as an optical guide; etching said third confinement layer and said contact layer of the upper stack, thereby leading to a planar upper face.
Claim 3
Dependent Claim
23 words
A process according to claim 1, wherein before depositing the first confinement layer, a contact conducting layer is deposited on the semi-insulating substrate.
Claim 4
Dependent Claim
54 words
A process according to claim 1, further comprising the step of etching a channel between the lower stack and the upper stack, thereby leading to an etched mirror on a side of said lower stack and the step of cleaving the lower stack forming a cleaved mirror on another side of said lower stack.
Claim 5
Dependent Claim
29 words
A process according to claim 1, wherein a distributed diffraction grating structure is given to the second confinement layer located on the transparent guidance layer of the upper stack.