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US4683149A Expired / Lapsed US ⏱️ 0.0 years remaining

Film forming process

Assignee: Nissin Electric Co Ltd
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Filing: 1986-05-06
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Granted: 1987-07-28
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Expires: 2006-05-06
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Abstract

Abstract A process and an apparatus for forming films, up to several microns in thickness, on substrates by the combination of ion implantation and vapor deposition; said apparatus comprising a vacuum chamber, means for transporting a substrate within the vacuum chamber, a first ion source having an accelerating voltage of 500 V to 5 kV and disposed at a first position along the direction of movement of the substrate within the vacuum chamber, a first evaporator disposed at a second position along the direction of movement of the substrate within the vacuum chamber, and a second ion source having an accelerating voltage of 10 kV to 100 kV and disposed at a third position along the direction of movement of the substrate within the vacuum chamber, and optionally further comprising a second evaporator disposed at a fourth position along the direction of movement of the substrate within the vacuum chamber, which may be provided with high-frequency exciting means disposed in a path of release of vapor from the second evaporator toward the substrate for ionizing the vapor, and means for forming an electric field for accelerating the ionized vapor toward the substrate.

Inventors

  • 👤 Yasuo Suzuki
  • 👤 Yasunori Ando

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 18:08
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/22; C23C14/56; C23C14/562; C23C14/24; C23C14/32; C23C14/48; C23C14/568

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 140 words
A process for forming a film of predetermined thickness on a substrate in a vacuum chamber comprising the steps of: (i) activating the surface of the substrate by exposing the surface to ions at an accelerating voltage of 500 V to 5 kV, (ii) forming a base deposition layer on the activated substrate surface by vapor deposition, the base deposition layer having a thickness not larger than the depth to which ions can be implanted in the layer, and (iii) implanting ions in the deposition layer at an accelerating voltage of 10 kV to 100 kV; the process, when required, further including (iv) subjecting, a desired number of times, the resulting deposition layer to (v) the step of vapor deposition or ion plating, and/or (vi) said steps (ii) and (iii), to form at least one layer over the deposition layer.
Claim 2
Dependent Claim 140 words
A process for forming a film of predetermined thickness on a substrate in a vacuum chamber comprising the steps of: (i) activating the surface of the substrate by exposing the surface to ions at an accelerating voltage of 500 V to 5 kV, (ii) forming a base deposition layer on the activated substrate surface by vapor deposition, the base deposition layer having a thickness not larger than the depth to which ions can be implanted in the layer, and (iii) implanting ions in the deposition layer at an accelerating voltage of 10 kV to 100 kV; the process, when required, further including (iv) subjecting, a desired number of times, the resulting deposition layer to (v) the step of vapor deposition or ion plating, and/or (vi) said steps (ii) and (iii), to form at least one layer over the deposition layer.
Claim 3
Dependent Claim 23 words
A process as defined in claim 1 wherein said step (iv) of forming at least one layer comprises a single vapor deposition step.
Claim 4
Dependent Claim 23 words
A process as defined in claim 1 wherein said step (iv) of forming at least one layer comprises a single ion plating step.
Claim 5
Dependent Claim 36 words
A process as defined in claim 1 wherein said step (iv) comprises a vapor deposition step, a base deposition step, an ion implanting step and a further vapor depostion step, which are conducted in said order.
Claim 6
Dependent Claim 14 words
A process as defined in claim 1 wherein the substrate is a steel strip.
Claim 7
Dependent Claim 39 words
A process as defined in claim 1 wherein the ions used in the steps (i) and (iii) are argon ion and a source of the vapor deposition used in the step (ii) and/or the step (v) is aluminum vapor.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-07-27 1991-01-26 1991-07-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-07-27 1995-01-26 1995-07-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-07-27 1999-01-26 1999-07-28 $7700.00 Window Closed / Lapsed

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