Patent US4381672A successfully refreshed from Google Patents.
US4381672A
Expired / Lapsed
US
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Vibrating beam rotation sensor
Assignee: Bendix Corp
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Filing: 1981-03-04
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Granted: 1983-05-03
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Expires: 2001-03-04
Abstract
Abstract A rotation sensor having a vibrating cantilever beam is disclosed herein. The sensor comprises an integral single crystal silicon cantilever beam and support structure, an oscillator circuit for generating an electrical signal vibrating the cantilever beam at or near its natural resonant frequency and a piezoresistive element formed at the base of the base of the vibrating beam. The piezoresistive element is only sensitive to the stresses induced in the beam due to the rotation of the beam about an axis parallel to its length.
Inventors
- 👤 James M. O'Connor
- 👤 David M. Shupe
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 19:41
CPC Classifications
G; G01; G01C; G01C19/00; G01C19/56; G01C19/5719
Claims Analysis
Total Claims: 46
Claim 1
Independent Claim
114 words
A rotation sensor comprising: a single crystal support structure having an axis of rotation; an integral cantilever beam supported from said support structure for vibration only in a predetermined plane relative to said support structure and parallel to said axis of rotation, said cantilever beam having a base end attached to said support structure and a free end; means for vibrating the free end of said cantilever beam in said predetermined plane; and first sensor means for detecting transverse stresses at said base resisting rotation of said vibrating cantilever beam about said axis to generate a signal having a value corresponding to the rotational velocity of said support structure about said axis of rotation.
Claim 2
Dependent Claim
114 words
A rotation sensor comprising: a single crystal support structure having an axis of rotation; an integral cantilever beam supported from said support structure for vibration only in a predetermined plane relative to said support structure and parallel to said axis of rotation, said cantilever beam having a base end attached to said support structure and a free end; means for vibrating the free end of said cantilever beam in said predetermined plane; and first sensor means for detecting transverse stresses at said base resisting rotation of said vibrating cantilever beam about said axis to generate a signal having a value corresponding to the rotational velocity of said support structure about said axis of rotation.
Claim 3
Dependent Claim
64 words
The rotation sensor of claim 1 wherein said means for vibrating said cantilever beam comprises: a beam electrode disposed on a surface of said cantilever beam; a fixed electrode supported by said support structure proximate said beam electrode; and oscillator means for generating an oscillating electric potential between said beam electrode and said fixed electrode to produce an electrostatic force vibrating said cantilever beam.
Claim 4
Dependent Claim
63 words
The rotation sensor of claim 2 wherein said oscillator means comprises: second sensor means for detecting the vibration of said cantilever beam to produce a signal having a frequency component corresponding to the vibration frequency of the cantilever beam; and amplifier means for amplifying the signal generated by said second sensor to generate said oscillating electric potential between said beam and fixed electrode.
Claim 5
Dependent Claim
15 words
The rotation sensor of claim 1 wherein said single crystal material is single crystal silicon.
Claim 6
Dependent Claim
32 words
The rotation sensor of claim 4 wherein said single crystal silicon has a 001 crystallagraphic axis parallel to said axes of rotation and a 110 crystallographic axis normal to said 001 axis.
Claim 7
Dependent Claim
27 words
The rotation sensor of claim 5 wherein said cantilever beam has a rectangular configuration, said 110 crystallographic axis is parallel to one surface of said cantilever beam.
Claim 8
Dependent Claim
19 words
The rotation sensor of claim 6 wherein said one surface is normal to the cantilever beams plane of vibration.
Claim 9
Dependent Claim
44 words
The rotation sensor of claim 6 or 7 wherein said first sensor means is a p-type piezoresistive element formed on said one surface of said cantilever beam adjacent to said base end, said piezoresistive element having an axis parallel to said 110 crystallographic axis.
Claim 10
Dependent Claim
74 words
The rotation sensor of claim 7 wherein said first sensor means comprises: a p-type piezoresistive element formed in said one surface adjacent to said base end, said piezoresistive element having an axis parallel to said 110 crystallographic axis, and first amplifier circuit means formed in the surface of said support structure and connected to said piezoresistive element for generating an output signal having a value indicative of the resistance value of said piezoresistive element.
Claim 11
Dependent Claim
67 words
The rotation sensor of claim 9 wherein said means for vibrating said cantilever beam comprises: a beam electrode disposed the surface of said cantilever beam opposite said one surface; a fixed electrode regidly supported by said support structure proximate said beam electrode; and oscillator means for generating an oscillating electric potential between said beam electrode and said fixed electrode to produce an electrostatic force vibrating said beam.
Claim 12
Dependent Claim
87 words
The rotation sensor of claim 10 wherein said oscillator means comprises: a second piezoresistive element formed on the surface of said cantilever beam adjacent to its base end, said second piezoresistive having a resistance value oscillating in response to the vibration of said cantilever beam; and an integrated oscillator circuit formed on the surface of said support structure, said integrated oscillator circuit generating said oscillating electric potential between said beam electrode and said fixed electrode in response to the oscillating resistance value of said second piezoresistive element.
Claim 13
Dependent Claim
42 words
The rotation sensor of claim 10 further including phase detector means for detecting the phase relationship between said oscillator means and the output of said first amplifier circuit means to generate a signal indicating the direction of rotation of said support structure.
Claim 14
Dependent Claim
41 words
The rotation sensor of claims 10 or 12 further including integrator means for integrating the output of said first amplifier circuit means to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position.
Claim 15
Dependent Claim
35 words
The rotation sensor of claims 10 or 12 further including differentiator means for differentiating the output of said first amplifier means to generate an acceleration signal indicative of the angular acceleration of said support structure.
Claim 16
Dependent Claim
67 words
The rotation sensor of claims 10 or 12 further including: integrator means for integrating the output of said first amplifier circuit means to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position; and differentiator means for differentiating the output of said first amplifier means to generate an acceleration signal indicative of the angular acceleration of said support structure.
Claim 17
Dependent Claim
63 words
The rotation sensor of claim 5 wherein said means for vibrating said cantilever beam comprises: a beam electrode disposed on a surface of said cantilever beam; a fixed electrode rigidly supported from said support structure proximate said beam electrode; and oscillator means for generating an oscillating electric potential between said beam and fixed electrodes to produce an electrostatic force vibrating said cantilever beam.
Claim 18
Dependent Claim
54 words
The rotation sensor of claim 16 wherein said oscillator means comprises: second sensor means for detecting the vibration of said cantilever beam to generate an output signal having a frequency corresponding to the vibrating frequency of the cantilever beams; and second amplifier means for amplifying said output signal to generate said oscillating electric potential.
Claim 19
Dependent Claim
44 words
The rotation sensor of claim 17 wherein said second sensor means is a second piezoresistive element formed on the surface of said cantilever beam adjacent to its base end and said amplifier is an integrated circuit formed on the surface of said support structure.
Claim 20
Dependent Claim
24 words
The rotation sensor of claim 18 wherein said second piezoresistive element has its axis parallel to the 001 crystallographic axis of said integral structure.
Claim 21
Dependent Claim
42 words
The rotation sensor of claim 1 further including phase detector means for detecting the phase relationship between said vibrating cantilever beam and the signal generated by said first sensor to generate a signal indicating the direction of rotation of said support structure.
Claim 22
Dependent Claim
41 words
The rotation sensor of claims 1 or 20 further including integrator means for integrating the signal generated by said first sensor means to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position.
Claim 23
Dependent Claim
35 words
The rotation sensor of claims 1 or 20 further including differentiator means for differentiating the signal generated by said first sensor to generate an acceleration signal indicative of the angular acceleration of said support structure.
Claim 24
Dependent Claim
66 words
The rotation sensor of claims 1 or 20 further including: integrator means for integrating the signal generated by said first sensor to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position; and differentiator means for differentiating the signal generated by said first detector to generate an acceleration signal indicative of the angular acceleration of said support structure.
Claim 25
Dependent Claim
86 words
A micromechanical angular rate sensor comprising: an integral single crystal support structure and cantilever beam, said cantilever beam supported from said support structure parallel to an axis of rotation; means for vibrating said cantilever beam in a plane parallel to said axis of rotation; and first sensor means for detecting the stresses at the base of said cantilever beam in a plane normal to said axis of rotation to generate a rate signal indicative of the rotation of said support structure about said axis of rotation.
Claim 26
Dependent Claim
86 words
A micromechanical angular rate sensor comprising: an integral single crystal support structure and cantilever beam, said cantilever beam supported from said support structure parallel to an axis of rotation; means for vibrating said cantilever beam in a plane parallel to said axis of rotation; and first sensor means for detecting the stresses at the base of said cantilever beam in a plane normal to said axis of rotation to generate a rate signal indicative of the rotation of said support structure about said axis of rotation.
Claim 27
Dependent Claim
15 words
The angular rate sensor of claim 24 wherein said single crystal is single crystal silicon.
Claim 28
Dependent Claim
63 words
The angular rate sensor of claim 25 wherein said single crystal silicon a 001 crystallographic axis parallel to said axis of rotation and a 110 crystallographic axis normal to said 001 axis; and said sensor means is a p-type piezoresistive element formed on said cantilever beam adjacent to said support structure, said piezoresistive element having an axis parallel to said 110 crystallographic axis.
Claim 29
Dependent Claim
44 words
The angular rate sensor of claim 26 further including first amplifier circuit means formed on the surface of said support structure and connected to said piezoresistive element for generating an output signal having a value indicative of the resistance value of said piezoresistive element.
Claim 30
Dependent Claim
65 words
The angular rate sensor of claim 26 wherein said means for vibrating said cantilever beam comprises: a beam electrode disposed on a surface of said cantilever beam; a fixed electrode supported by said support structure proximate said beam electrode; and oscillator means for generating an oscillating electric potential between said beam electrode and said fixed electrode to produce an electrostatic force vibrating said cantilever beam.
Claim 31
Dependent Claim
55 words
The angular rate sensor of claim 28 wherein said oscillator means comprises: second sensor means for detecting the vibration of said cantilever beam to generate an output signal having a frequency corresponding to the vibrating frequency of the cantilever beams; and second amplifier means for amplifying said output signal to generate said oscillating electric potential.
Claim 32
Dependent Claim
45 words
The angular rate sensor of claim 29 wherein said second sensor means is a second piezoresistive element formed on the surface of said cantilever beam adjacent to said support structure and said amplifier is an integrated circuit formed on the surface of said support structure.
Claim 33
Dependent Claim
44 words
The angular rate sensor of claim 29 further including phase detector means for detecting the phase relationship between the output signals of said first and second amplifiers to generate a direction signal indicating the direction the support structure is rotating with respect to axis.
Claim 34
Dependent Claim
42 words
The angular rate sensor of claim 31 further including integrator means for integrating the output of said first amplifier with respect to time to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position.
Claim 35
Dependent Claim
39 words
The angular rate sensor of claim 31 or 32 further including a differentiator circuit for differentiating the output of said first amplifier with respect to time to generate a signal indicative of the angular acceleration of sid support structure.
Claim 36
Independent Claim
68 words
A method for sensing a rotation comprising the steps of: vibrating a single crystal silicon cantilever beam in a predetermined plane relative to a support structure; and detecting the stress induced in said cantilever beam resisting the displacement of said vibrating beam from said predetermined plane due to a rotation of said support structure to generate a rate signal having a value proportional to the rate of rotation.
Claim 37
Independent Claim
68 words
A method for sensing a rotation comprising the steps of: vibrating a single crystal silicon cantilever beam in a predetermined plane relative to a support structure; and detecting the stress induced in said cantilever beam resisting the displacement of said vibrating beam from said predetermined plane due to a rotation of said support structure to generate a rate signal having a value proportional to the rate of rotation.
Claim 38
Dependent Claim
108 words
The method of claim 34 wherein the 001 crystallographic axis of said single crystal silicon is parallel to the length of said cantilever beam and said 110 crystallographic axis is normal to said beam, said step of vibrating vibrates said beam in a plane normal to said 110 crystallographic axis and said step of detecting includes detecting with a piezoresistive element formed on the surface of said cantilever beam with its length parallel to said 110 crystallographic axis to generate said rate signal having a value proportional to the stress induced in said cantilever beam due to a rotation about an axis parallel to said 001 crystallographic axis.
Claim 39
Dependent Claim
42 words
The method of claim 35 wherein said step of detecting further includes converting the changes in the resistance value of said piezoresistive element due to said rotation to generate an electrical rate signal having a value proportional to the rate of rotation.
Claim 40
Dependent Claim
46 words
The method of claim 36 wherein said step of vibrating comprises: generating an oscillating electrical signal; applying said oscillating signal between a fixed electrode and an electrode disposed on said cantilever beam to generate an electric field therebetween and produce an electrostatic force vibrating said beam.
Claim 41
Dependent Claim
31 words
The method of claim 37 wherein said step of generating an oscillating electrical signal generates an oscillating electric signal having a frequency corresponding to the resonant frequency of said cantilever beam.
Claim 42
Dependent Claim
51 words
The method of claim 38 wherein said step of generating an oscillating field comprises the steps of: detecting the vibration of said cantilever beam to generate an intput signal having a frequency component corresponding to the vibrating frequency of said beam; and amplifying said input signal to generate said electrical signal.
Claim 43
Dependent Claim
43 words
The method of claim 39 wherein said step of detecting the vibration frequency of said cantilever beam comprises the steps of: detecting with a piezoresistive element formed on the surfaces of said beam the stresses induced in said beam due to its vibration.
Claim 44
Dependent Claim
20 words
The method of claim 40 further including the step of differentiating said rate signal to generate an angular acceleration signal.
Claim 45
Dependent Claim
33 words
The method of claim 37 further including the step of comparing the phase of said electrical rate signal with said electrical signal to generate a phase signal indicative of the direction of rotation.
Claim 46
Independent Claim
33 words
The method of claims 40 or 42 further including the step of integrating said rate signal to generate a displacement signal indicative of the angle through which the vibrating cantilever beam was rotated.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-05-02 | 1986-11-01 | 1987-05-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-05-02 | 1990-11-01 | 1991-05-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-05-02 | 1994-11-01 | 1995-05-03 | $7700.00 | Window Closed / Lapsed |