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Patent US4380488A successfully refreshed from Google Patents.
US4380488A
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Process and gas mixture for etching aluminum
Assignee: Branson International Plasma Corp
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Filing: 1981-11-02
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Granted: 1983-04-19
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Expires: 2001-11-02
Abstract
Abstract Process and gas mixture for etching aluminum in a plasma environment in a planar reactor. The gas mixture comprises a primary etching gas and a secondary gas which controls the anisotropic character of the etch. A stable uniform plasma is generated at relatively high pressure and power levels, and this provides substantially faster removal of aluminum than has heretofore been possible in planar reactors.
Inventors
- 👤 Richard F. Reichelderfer
- 👤 Diane C. Vogel
- 👤 Marian C. Tang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 17:47
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; C; C23; C23F; C23F4/00
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
142 words
In a process for etching aluminum in a reactor having a chamber and a pair of spaced apart generally planar electrodes, the steps of: positioning the aluminium between the electrodes in the reactor chamber, admitting a primary etching gas mixture selected from the group consisting of BCl 3 and chlorine, CCl 4 and chlorine, and combinations thereof to the chamber at a pressure on the order of 140-450 microns, admitting a secondary gas selected from the group consisting of SiCl 4 , CHCl 3 , CCl 4 and combinations thereof to the chamber at a pressure on the order of 190-300 microns to control the anisotropic character of the etch, said primary gas mixture and the secondary gas being present in the chamber at the same time, and energizing the electrodes to ionize the gas and form active species between the electrodes.
Claim 2
Dependent Claim
142 words
In a process for etching aluminum in a reactor having a chamber and a pair of spaced apart generally planar electrodes, the steps of: positioning the aluminium between the electrodes in the reactor chamber, admitting a primary etching gas mixture selected from the group consisting of BCl 3 and chlorine, CCl 4 and chlorine, and combinations thereof to the chamber at a pressure on the order of 140-450 microns, admitting a secondary gas selected from the group consisting of SiCl 4 , CHCl 3 , CCl 4 and combinations thereof to the chamber at a pressure on the order of 190-300 microns to control the anisotropic character of the etch, said primary gas mixture and the secondary gas being present in the chamber at the same time, and energizing the electrodes to ionize the gas and form active species between the electrodes.
Claim 3
Dependent Claim
34 words
The process of claim 1 wherein the primary etching gas mixture contains BCl 3 at a pressure on the order of 70-200 microns and chlorine at a pressure on the order of 70-250 microns.
Claim 4
Dependent Claim
30 words
The process of claim 1 wherein photoresist is employed in proximity to the aluminum, and a third gas is admitted to the chamber to preserve the integrity of the photoresist.
Claim 5
Dependent Claim
20 words
The process of claim 3 wherein the third gas is helium at a pressure on the order of 0.7-2.5 torr.
Claim 6
Dependent Claim
26 words
The process of claim 1 wherein the gas is introduced into the chamber by diffusion through one of the electrodes into the region between the electrodes.
Claim 7
Dependent Claim
18 words
The process of claim 1 wherein a DC bias is maintained on the electrodes during the etching process.
Claim 8
Dependent Claim
38 words
The process of claim 1 wherein the electrodes are on the order of 31/2-41/2 inches in diameter, separated by a distance on the order of 0.5-2 inches, and energized with a power on the order of 50-400 watts.
Claim 9
Dependent Claim
127 words
In a process for removing aluminum from a substrate with photoresist masking in a reactor having a chamber and a pair of generally planar electrodes, the steps of: positioning the substrate between the electrodes in the reactor chamber, admitting a primary etching gas comprising a mixture of BCl 3 at a pressure on the order of 150 microns and chlorine at a pressure on the order of 155 microns to the chamber, admitting SiCl 4 to the chamber at a pressure on the order of 190-300 microns to control the anisotropic character of the aluminum removal, admitting helium to the chamber at a pressure on the order of 0.7-1.1 torr to prevent breakdown of the photoresist, and energizing the electrodes to ionize the gas between the electrodes.
Claim 10
Dependent Claim
127 words
In a process for removing aluminum from a substrate with photoresist masking in a reactor having a chamber and a pair of generally planar electrodes, the steps of: positioning the substrate between the electrodes in the reactor chamber, admitting a primary etching gas comprising a mixture of BCl 3 at a pressure on the order of 150 microns and chlorine at a pressure on the order of 155 microns to the chamber, admitting SiCl 4 to the chamber at a pressure on the order of 190-300 microns to control the anisotropic character of the aluminum removal, admitting helium to the chamber at a pressure on the order of 0.7-1.1 torr to prevent breakdown of the photoresist, and energizing the electrodes to ionize the gas between the electrodes.
Claim 11
Dependent Claim
26 words
The process of claim 8 wherein the gas is introduced into the chamber by diffusion through one of the electrodes into the region between the electrodes.
Claim 12
Dependent Claim
65 words
A gas mixture for etching aluminum in a plasma environment, comprising: a primary etching gas comprising a mixture of BCl 3 at a pressure on the order of 70-200 microns and chlorine at a pressure on the order of 70-250 microns, and a secondary gas comprising SiCl 4 at a pressure on the order of 190-300 microns for controlling the anisotropic character of the etch.
Claim 13
Dependent Claim
65 words
A gas mixture for etching aluminum in a plasma environment, comprising: a primary etching gas comprising a mixture of BCl 3 at a pressure on the order of 70-200 microns and chlorine at a pressure on the order of 70-250 microns, and a secondary gas comprising SiCl 4 at a pressure on the order of 190-300 microns for controlling the anisotropic character of the etch.
Claim 14
Dependent Claim
33 words
The gas mixture of claim 10 including a third gas comprising helium at a pressure on the order of 0.7-1 torr for preserving the integrity of photoresist in a proximity to the aluminum.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-04-18 | 1986-10-18 | 1987-04-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-04-18 | 1990-10-18 | 1991-04-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-04-18 | 1994-10-18 | 1995-04-19 | $7700.00 | Window Closed / Lapsed |