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US4132614A
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Etching by sputtering from an intermetallic target to form negative metallic ions which produce etching of a juxtaposed substrate
Assignee: International Business Machines Corp
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Filing: 1977-10-26
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Granted: 1979-01-02
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Expires: 1997-10-26
Abstract
Abstract Bombardment some intermetallic compounds above a sufficient target voltage V o can be used for etching substrates. Etching a substrate located in an evacuated chamber involves bombardment of an intermetallic compound or alloy comprising for example Au, Pt, etc. and a metallic element such as Eu, La, Cs, etc. with ions so that a large flux of negative Au, Pt, etc. ions is produced which etches a substrate located nearby. Such bombardment is achieved by placing an Au, Pt, etc. intermetallic composition target in a sputtering chamber using an argon sputtering gas, located opposite from a substrate. A gold alloy or compound target can be SmAu, EuAu, LaAu, CsAu, etc. The target of Au, Pt, etc. and a rare earth element, etc. is bombarded by sputtering gas atoms excited by RF or D.C. energy, creating negative metal ions by sputtering. Instead of depositing upon the substrate, the negative ions cause a cascade of energetic sputtering gas atoms and metal atoms to etch the substrate surface directly beneath the target as outlined by ground shields. Outside that region negative ion and rare earth metals deposit on the substrate. Bombardment with an ion gun, neutral atoms or energetic particle sources or an ionic molecular source may produce negative ions. A use is ion milling. A target material is useful as a negative ion source of metal B in an intermetallic compound of metals A and B if A has ionization potential I A and B has electron affinity EA B such that I A -EA B > about 3.4 electron volts or if there is a electronegativity difference ΔX greater than about 2.55.
Inventors
- 👤 Jerome J. Cuomo
- 👤 Richard J. Gambino
- 👤 James M. E. Harper
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 16:16
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/34; H01J37/3411; H01J37/3414; H01J37/3426
Claims Analysis
Total Claims: 34
Claim 1
Independent Claim
140 words
Apparatus comprising an evacuable vacuum chamber including a target and a source of energetic particles for bombarding said target, wherein said target constitutes a negative-metallic-ion-source material which comprises a source of negative ions of a metal B included in an intermetallic composition including at least two metals A and B, metal B being adapted when in combination with metal A to be ionized to a substantial degree to form quantities of negative ions of metal B upon bombardment by energetic particles of atomic dimensions wherein metal A has an electronegativity X A and metal B has an electronegativity X B such that X B - X A is greater than about 2.55 electron Volts, with the exception of combinations of metals having a values of Q less than about 0.314, where Q is the fractional ionicity of said intermetallic composition.
Claim 2
Dependent Claim
140 words
Apparatus comprising an evacuable vacuum chamber including a target and a source of energetic particles for bombarding said target, wherein said target constitutes a negative-metallic-ion-source material which comprises a source of negative ions of a metal B included in an intermetallic composition including at least two metals A and B, metal B being adapted when in combination with metal A to be ionized to a substantial degree to form quantities of negative ions of metal B upon bombardment by energetic particles of atomic dimensions wherein metal A has an electronegativity X A and metal B has an electronegativity X B such that X B - X A is greater than about 2.55 electron Volts, with the exception of combinations of metals having a values of Q less than about 0.314, where Q is the fractional ionicity of said intermetallic composition.
Claim 3
Dependent Claim
40 words
Apparatus in accordance with claim 1 wherein said metal B is Au and said metal A has an electronegativity less than about 3.09 with the exception of combinations of said metals having a value of Q less than about 0.314.
Claim 4
Dependent Claim
25 words
Apparatus in accordance with claim 2 wherein said metal A is selected from the group including: Ce, Pm, Sm, La, Eu, Pr, Nd and Cs.
Claim 5
Dependent Claim
31 words
Apparatus in accordance with claim 1 wherein said metal B is Au and said metal A is selected from the group including: Ce, Pm, Sm, La, Eu, Pr, Nd, and Cs.
Claim 6
Dependent Claim
12 words
Apparatus in accordance with claim 1 wherein said metal B is Au.
Claim 7
Dependent Claim
12 words
Apparatus in accordance with claim 5 wherein said metal A is Ce.
Claim 8
Dependent Claim
12 words
Apparatus in accordance with claim 5 wherein said metal A is Pm.
Claim 9
Dependent Claim
12 words
Apparatus in accordance with claim 5 wherein said metal A is Sm.
Claim 10
Dependent Claim
12 words
Apparatus in accordance with claim 5 wherein said metal A is La.
Claim 11
Dependent Claim
12 words
Apparatus in accordance with claim 5 wherein said metal A is Eu.
Claim 12
Dependent Claim
12 words
Apparatus in accordance with claim 5 wherein said metal A is Pr.
Claim 13
Dependent Claim
12 words
Apparatus in accordance with claim 5 wherein said metal A is Nd.
Claim 14
Dependent Claim
12 words
Apparatus in accordance with claim 5 wherein said metal A is Cs.
Claim 15
Dependent Claim
247 words
Apparatus comprising an evacuable vacuum chamber including a target and a source of energetic particles for bombarding said target, wherein said targets constitutes a negative-metallic-ion-source material which comprises a source of negative ions of a metal B included in an intermetallic composition including at least two metals A and B, wherein metal B is adapted when in combination with metal A to be ionized in effective amounts to form quantities of negative ions of metal B upon bombardment by energetic particles of atomic dimensions, said material comprising a composition selected from one of the following groups of A and B metals including a group in which the B metal is Au and the A metal is selected from the group including: Li, Na, K, Rb, Sr, In, Cs, Ba, La, Ce, Pr, Nd, Pm, Sm, Eu, Tb, and Dy; a group in which the B metal is Pt and the A metal is selected from the group including: Li, Na, K, Rb, Cs, Ba, La, Ce, Pr, and Nd; a group in which the B metal is selected from the group including: Ir, Hg, Po, and Os and the A metal is selected from the group including: K, Rb, Cs, and Ba; a group in which the B metal is Os and the A metal is selected from the group including: Rb and Cs; and a group in which the B metal is selected from the group including: Sb and Zn and the A metal is Cs.
Claim 16
Dependent Claim
247 words
Apparatus comprising an evacuable vacuum chamber including a target and a source of energetic particles for bombarding said target, wherein said targets constitutes a negative-metallic-ion-source material which comprises a source of negative ions of a metal B included in an intermetallic composition including at least two metals A and B, wherein metal B is adapted when in combination with metal A to be ionized in effective amounts to form quantities of negative ions of metal B upon bombardment by energetic particles of atomic dimensions, said material comprising a composition selected from one of the following groups of A and B metals including a group in which the B metal is Au and the A metal is selected from the group including: Li, Na, K, Rb, Sr, In, Cs, Ba, La, Ce, Pr, Nd, Pm, Sm, Eu, Tb, and Dy; a group in which the B metal is Pt and the A metal is selected from the group including: Li, Na, K, Rb, Cs, Ba, La, Ce, Pr, and Nd; a group in which the B metal is selected from the group including: Ir, Hg, Po, and Os and the A metal is selected from the group including: K, Rb, Cs, and Ba; a group in which the B metal is Os and the A metal is selected from the group including: Rb and Cs; and a group in which the B metal is selected from the group including: Sb and Zn and the A metal is Cs.
Claim 17
Independent Claim
153 words
A method of etching a substrate located across from a target electrode in a partially evacuated sputtering chamber wherein a sputtering gas is employed to bombard said target electrode characterized in that said electrode composed of an intermetallic composition of an A metal and a B metal is being bombarded with energetic particles of atomic dimensions and the target voltage V t exceeds the etching threshold voltage V o , metal A has an electronegativity X A and metal B has an electronegativity X B such that X B - X A is greater than about 2.55 electron Volts, with the exception of combinations of metals having a value of Q of less than about 0.314, and a quantity of the B atoms leaving said target electrode and negative ions and said ions possess sufficient energy to produce an effective amount of etching, where Q is the fractional ionicity of said intermetallic composition.
Claim 18
Independent Claim
153 words
A method of etching a substrate located across from a target electrode in a partially evacuated sputtering chamber wherein a sputtering gas is employed to bombard said target electrode characterized in that said electrode composed of an intermetallic composition of an A metal and a B metal is being bombarded with energetic particles of atomic dimensions and the target voltage V t exceeds the etching threshold voltage V o , metal A has an electronegativity X A and metal B has an electronegativity X B such that X B - X A is greater than about 2.55 electron Volts, with the exception of combinations of metals having a value of Q of less than about 0.314, and a quantity of the B atoms leaving said target electrode and negative ions and said ions possess sufficient energy to produce an effective amount of etching, where Q is the fractional ionicity of said intermetallic composition.
Claim 19
Dependent Claim
41 words
A method in accordance with claim 15 wherein said metal B is Au and said metal A has an electronegativity less than about 3.09 with the exception of combinations of said metals having a value of Q less than about 0.314.
Claim 20
Dependent Claim
26 words
A method in accordance with claim 16 wherein said metal A is selected from the group including: Ce, Pm, Sm, La, Eu, Pr, Nd and Cs.
Claim 21
Dependent Claim
32 words
A method in accordance with claim 15 wherein said metal B is Au and said metal A is selected from the group including: Ce, Pm, Sm, La, Eu, Pr, Nd, and Cs.
Claim 22
Dependent Claim
13 words
A method in accordance with claim 15 wherein said metal B is Au.
Claim 23
Dependent Claim
13 words
A method in accordance with claim 19 wherein said metal A is Ce.
Claim 24
Dependent Claim
13 words
A method in accordance with claim 19 wherein said metal A is Pm.
Claim 25
Dependent Claim
13 words
A method in accordance with claim 19 wherein said metal A is Sm.
Claim 26
Dependent Claim
13 words
A method in accordance with claim 19 wherein said metal A is La.
Claim 27
Dependent Claim
13 words
A method in accordance with claim 19 wherein said metal A is Eu.
Claim 28
Dependent Claim
13 words
A method in accordance with claim 19 wherein said metal a is Pr.
Claim 29
Dependent Claim
13 words
A method in accordance with claim 19 wherein said metal A is Nd.
Claim 30
Dependent Claim
13 words
A method in accordance with claim 19 wherein said metal A is Cs.
Claim 31
Independent Claim
285 words
A method of etching a substrate located across from a target in a sputtering chamber characterized in that a negative-metallic-ion-source material target of a metal B included in an imtermetallic composition including at least two metals A and B, wherein metal B is in combination with metal A and metal B is ionized in effective amounts by maintaining the target potential V t above the etching threshold voltage V o to form quantities of negative ions of metal B upon bombardment by energetic particles of atomic dimensions, said material comprising a composition selected from one of the following groups of A and B metals including a group in which the B metal is Au and the A metal is selected from the group including: Li, Na, K, Rb, Sr, In, Cs, Ba, La, Ce, Pr, Nd, Pm, Sm, Eu, Tb, and Dy; a group in which the B metal is Pt and the A metal is selected from the group including: Li, Na, K, Rb, Cs, Ba, La, Ce, Pr, and Nd; a group in which the B metal is selected from the group including Ir, Hg, Po, and Os and the A metal is selected from the group including: K, Rb, Cs, and Ba; a group in which the B metal is Os and the A metal is selected from the group including Rb and Cs; a group in which the B metal is selected from the group including: Sb and Zn and the A metal is Cs; and a source of energetic atomic particles is directed to bombard said source material to produce etching of said substrate by negative B ions, with etching of the surface of said substrate opposite from said material.
Claim 32
Independent Claim
285 words
A method of etching a substrate located across from a target in a sputtering chamber characterized in that a negative-metallic-ion-source material target of a metal B included in an imtermetallic composition including at least two metals A and B, wherein metal B is in combination with metal A and metal B is ionized in effective amounts by maintaining the target potential V t above the etching threshold voltage V o to form quantities of negative ions of metal B upon bombardment by energetic particles of atomic dimensions, said material comprising a composition selected from one of the following groups of A and B metals including a group in which the B metal is Au and the A metal is selected from the group including: Li, Na, K, Rb, Sr, In, Cs, Ba, La, Ce, Pr, Nd, Pm, Sm, Eu, Tb, and Dy; a group in which the B metal is Pt and the A metal is selected from the group including: Li, Na, K, Rb, Cs, Ba, La, Ce, Pr, and Nd; a group in which the B metal is selected from the group including Ir, Hg, Po, and Os and the A metal is selected from the group including: K, Rb, Cs, and Ba; a group in which the B metal is Os and the A metal is selected from the group including Rb and Cs; a group in which the B metal is selected from the group including: Sb and Zn and the A metal is Cs; and a source of energetic atomic particles is directed to bombard said source material to produce etching of said substrate by negative B ions, with etching of the surface of said substrate opposite from said material.
Claim 33
Independent Claim
80 words
A method of thin film procesing including the steps of negative ion etching a substrate housed in an evacuated vacuum chamber containing a sputtering gas by means of negative metallic ions generated from a target electrode of intermetallic composition at a voltage V t greater than the etching threshold voltage V o of said target electrode followed by lowering said voltage V t below voltage V o for sputtering and depositing of material from said target electrode onto said substrate.
Claim 34
Independent Claim
80 words
A method of thin film procesing including the steps of negative ion etching a substrate housed in an evacuated vacuum chamber containing a sputtering gas by means of negative metallic ions generated from a target electrode of intermetallic composition at a voltage V t greater than the etching threshold voltage V o of said target electrode followed by lowering said voltage V t below voltage V o for sputtering and depositing of material from said target electrode onto said substrate.
References Cited (Backward Citations)
US3573454A
Cited
US3573185A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-01-01 | 1982-07-03 | 1983-01-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-01-01 | 1986-07-03 | 1987-01-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-01-01 | 1990-07-03 | 1991-01-02 | $7700.00 | Window Closed / Lapsed |