Patent US4065211A successfully refreshed from Google Patents.
US4065211A
Expired / Lapsed
US
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Precision X-ray diffraction system incorporating a laser aligner
Assignee: United States Department of the Army
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Filing: 1976-03-01
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Granted: 1977-12-27
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Expires: 1996-03-01
Abstract
Abstract An X-ray diffraction system for crystal analysis employing laser alignmento reduce errors inherent in the mechanical operation of the goniometer apparatus.
Inventors
- 👤 John R. Vig
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 11:29
CPC Classifications
G; G01; G01B; G01B11/00; G01B11/26
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
206 words
A method by which the angle between an atomic plane of a crystal plate and the face of the crystal plate can be determined by means of a goniometer instrument including an X-ray detector arranged to receive that portion of an incident X-ray beam reflected from said crystal plate, said crystal plate being mounted for independent rotation about three mutually perpendicular axes, a first axis being normal to the instrument plane defined by said X-ray beam and the center of said X-ray detector, a second axis being normal to the crystal plate face, and a third axis perpendicular to said first and second axes, comprising the steps of: a. directing a collimated optical beam onto the crystal plate face for reflection therefrom onto a position sensing photodetector; b. sequentially and controllably adjusting the rotation of said crystal plate about said first and second axes to discrete controlled positions at each of which a peak reading of the X-ray detector is obtained; and c. adjusting the rotation of said crystal plate about said first and third axes after each of the adjustments about said second axis to obtain a null reading of said photodetector indicating correction of any wobble of said second axis introduced during step (b).
Claim 2
Independent Claim
206 words
A method by which the angle between an atomic plane of a crystal plate and the face of the crystal plate can be determined by means of a goniometer instrument including an X-ray detector arranged to receive that portion of an incident X-ray beam reflected from said crystal plate, said crystal plate being mounted for independent rotation about three mutually perpendicular axes, a first axis being normal to the instrument plane defined by said X-ray beam and the center of said X-ray detector, a second axis being normal to the crystal plate face, and a third axis perpendicular to said first and second axes, comprising the steps of: a. directing a collimated optical beam onto the crystal plate face for reflection therefrom onto a position sensing photodetector; b. sequentially and controllably adjusting the rotation of said crystal plate about said first and second axes to discrete controlled positions at each of which a peak reading of the X-ray detector is obtained; and c. adjusting the rotation of said crystal plate about said first and third axes after each of the adjustments about said second axis to obtain a null reading of said photodetector indicating correction of any wobble of said second axis introduced during step (b).
Claim 3
Dependent Claim
235 words
The method of claim 1 wherein the crystal plate is initially mounted with the angle between the crystal plate face and the incident X-ray beam near the Bragg angle and with the crystal plate face substantially normal to the instrument plane and wherein step (b) of claim 1 includes the steps of b 1 . rotating the crystal plate about said second axis to the two distinct positions at which the angle between the atomic plane of the crystal plate and the incident X-ray beam is at the Bragg angle as evidenced by X-ray detector peak readings; b 2 . rotating the crystal plate about said first axis until the two positions of step (b 1 ) are substantially 180° apart; b 3 . rotating the crystal plate about said second axis by 90° in either direction from one only of the positions established at step (b 1 ) and adjusting the rotation of the crystal plate about said first axis until a peak reading of the X-ray detector is attained; b 4 . rotating the crystal plate about said first axis to the position attained in step (b 2 ); and b 5 . rotating the crystal plate about said second axis by 180° from the position at step (b 3 ) and adjusting the rotation of the crystal plate about said first axis until a peak reading of the X-ray detector is attained.
Claim 4
Dependent Claim
55 words
The method of claim 2 wherein the angle of said rotation about said first axis in steps (b 3 ) and (b 5 ) of claim 2 is measured separately, from which the angle between the atomic plane and the plate face of the crystal can be taken as the average of said two measurements.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-12-26 | 1981-06-27 | 1981-12-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-12-26 | 1985-06-27 | 1985-12-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-12-26 | 1989-06-27 | 1989-12-27 | $7700.00 | Window Closed / Lapsed |