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US3930870A Expired / Lapsed US ⏱️ 0.0 years remaining

Silicon polishing solution preparation

Assignee: International Business Machines Corp
•
Filing: 1973-12-28
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Granted: 1976-01-06
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Expires: 1993-12-28
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Abstract

Abstract An improved process for preparing a polishing solution for use in the chemical-mechanical polishing of silicon comprising copper nitrate, ammonium fluoride, nitric acid and ammonium nitrate. The latter two components are added to the copper nitrate, the system mixed well and then the ammonium fluoride added. The process eliminates the need for settling, decantation or filtration during solution preparation and permits substantially lowered amounts of copper nitrate to be used for silicon polishing. The silicon polishing solution is also described.

Inventors

  • 👤 Jagtar Singh Basi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 13:12
CPC Classifications
H; H10; H10P; H10P52/00; H10P52/40; H10P52/402

Claims Analysis

Total Claims: 18
Claim 1
Independent Claim 63 words
In a process for preparing a silicon chemical-mechanical polishing solution comprising cupric nitrate and ammonium fluoride in water in an amount effective to chemical-mechanical polish silicon, the improvement which comprises bringing cupric nitrate, ammonium nitrate and nitric acid into aqueous solution and then adding thereto ammonium fluoride, said nitric acid and ammonium nitrate being present in an amount effective to prevent copper precipitation.
Claim 2
Dependent Claim 63 words
In a process for preparing a silicon chemical-mechanical polishing solution comprising cupric nitrate and ammonium fluoride in water in an amount effective to chemical-mechanical polish silicon, the improvement which comprises bringing cupric nitrate, ammonium nitrate and nitric acid into aqueous solution and then adding thereto ammonium fluoride, said nitric acid and ammonium nitrate being present in an amount effective to prevent copper precipitation.
Claim 3
Dependent Claim 29 words
The process of claim 1 where the cupric nitrate is in the trihydrate form and the amount of cupric nitrate is greater than about 20 g/l of polishing solution.
Claim 4
Dependent Claim 20 words
The process of claim 2 where the amount of cupric nitrate is less than about 100 g/l of polishing solution.
Claim 5
Dependent Claim 32 words
The process of claim 2 where the ammonium fluoride is present in a concentration sufficient to provide a fluoride ion normality of about 2.1 to about 2.2 N in the polishing solution.
Claim 6
Dependent Claim 30 words
The process of claim 2 where the nitric acid is present in an amount of from about 6 to about 12 cc/l of polishing solution, calculated as 70% nitric acid.
Claim 7
Dependent Claim 22 words
The process of claim 5 where the ammonium nitrate is present in an amount greater than about 10 g/l of polishing solution.
Claim 8
Dependent Claim 60 words
The process of claim 2 where the polishing solution comprises: about 20 to about 100 g/l of cupric nitrate trihydrate; sufficient ammonium fluoride to provide a fluoride ion normality of about 2.1 to about 2.2 N; from about 6 to about 12 cc/l of nitric acid, calculated as 70% nitric acid; and greater than about 10 g/l of ammonium nitrate.
Claim 9
Dependent Claim 76 words
In a silicon chemical-mechanical polishing solution comprising cupric nitrate and ammonium fluoride in water in an amount effective to chemical-mechanical polish silicon, the improvement which comprises said silicon chemical-mechanical polishing solution further comprising nitric acid and ammonium nitrate in an amount effective to prevent the precipitation of copper from said cupric nitrate, said cupric nitrate being present in an amount which would cause copper precipitation but for the presence of said nitric acid and ammonium nitrate.
Claim 10
Dependent Claim 76 words
In a silicon chemical-mechanical polishing solution comprising cupric nitrate and ammonium fluoride in water in an amount effective to chemical-mechanical polish silicon, the improvement which comprises said silicon chemical-mechanical polishing solution further comprising nitric acid and ammonium nitrate in an amount effective to prevent the precipitation of copper from said cupric nitrate, said cupric nitrate being present in an amount which would cause copper precipitation but for the presence of said nitric acid and ammonium nitrate.
Claim 11
Dependent Claim 31 words
The chemical-mechanical polishing solution of claim 8 where the cupric nitrate is in the trihydrate form and the amount of cupric nitrate is greater than about 20 g/l of polishing solution.
Claim 12
Dependent Claim 22 words
The chemical-mechanical polishing solution of claim 9 where the amount of cupric nitrate is less than about 100 g/l of polishing solution.
Claim 13
Dependent Claim 34 words
The chemical-mechanical polishing solution of claim 9 where the ammonium fluoride is present in a concentration sufficient to provide a fluoride ion normality of about 2.1 to about 2.2 N in the polishing solution.
Claim 14
Dependent Claim 32 words
The chemical-mechanical polishing solution of claim 9 where the nitric acid is present in an amount of from about 6 to about 12 cc/l of polishing solution calculated as 70% nitric acid.
Claim 15
Dependent Claim 24 words
The chemical-mechanical polishing solution of claim 12 where the ammonium nitrate is present in an amount greater than about 10 g/l of polishing solution.
Claim 16
Dependent Claim 62 words
The chemical-mechanical polishing solution of claim 9 where the polishing solution comprises: about 20 to about 100 g/l of cupric nitrate trihydrate; sufficient ammonium fluoride to provide a fluoride ion normality of about 2.1 to about 2.2 N; from about 6 to about 12 cc/l of nitric acid, calculated as 70% nitric acid; and greater than about 10 g/l of ammonium nitrate.
Claim 17
Dependent Claim 19 words
The process of claim 7 where said ammonium nitrate is present in an amount up to about 20 g/l.
Claim 18
Dependent Claim 22 words
The chemical-mechanical polishing solution of claim 14 where the ammonium nitrate is present in an amount of up to about 20 g/l.

References Cited (Backward Citations)

US2410322A Cited
US2588253A Cited
GB693776A Cited
US2814589A Cited
US3088889A Cited
US3155556A Cited
US3436259A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1979-01-05 1979-07-07 1980-01-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1983-01-05 1983-07-07 1984-01-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1987-01-05 1987-07-07 1988-01-06 $7700.00 Window Closed / Lapsed

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