Patent US3824453A successfully refreshed from Google Patents.
US3824453A
Expired / Lapsed
US
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Method of determining concentrations
Assignee: Texas Instruments Inc
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Filing: 1972-02-04
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Granted: 1974-07-16
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Expires: 1992-02-04
Abstract
Abstract A reference electrode and test electrode comprising a body of semi-conductor material having an element incorporated in it are positioned in a solution containing the element and the potential between the electrodes is measured. If the concentration of the element in the solution is known, the potential indicates the concentration of the element in the test electrode. Conversely, if the concentration in the test electrode is known, the potential indicates the concentration in the solution. In the latter case, the test electrode is prepared by plating a compound containing the element onto a body of semi-conductor material and diffusing the element into the body.
Inventors
- 👤 C Baker
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 15:22
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/26; G01N27/28; G01N27/30
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
131 words
In an electrolytic cell having a reference electrode, a semiconductor material containing an element of unknown concentration therein, and means for measuring voltage potential, the method of determining the concentration of said element contained in said semiconductor material including the steps of: a. dissolving s substance containing a known quantity of said element in said electrolytic cell to form a solution having a preselected concentration of ions of said element; b. forming a test electrode comprising said semiconductor material containing an unknown quantity of said element whose concentration is to be determined; c. positioning said reference electrode and said test electrode in the solution; d. measuring the potential between the reference electrode and the test electrode; and e. deriving the concentration of said element in said semiconductor material from said potential.
Claim 2
Dependent Claim
131 words
In an electrolytic cell having a reference electrode, a semiconductor material containing an element of unknown concentration therein, and means for measuring voltage potential, the method of determining the concentration of said element contained in said semiconductor material including the steps of: a. dissolving s substance containing a known quantity of said element in said electrolytic cell to form a solution having a preselected concentration of ions of said element; b. forming a test electrode comprising said semiconductor material containing an unknown quantity of said element whose concentration is to be determined; c. positioning said reference electrode and said test electrode in the solution; d. measuring the potential between the reference electrode and the test electrode; and e. deriving the concentration of said element in said semiconductor material from said potential.
Claim 3
Dependent Claim
27 words
The method of determining the concentration of an element according to claim 1 wherein the element is present in the body of semi-conductor material as an impurity.
Claim 4
Dependent Claim
20 words
The method of determining an element according to claim 1 wherein the solution comprises an aqueous solution of the element.
Claim 5
Dependent Claim
18 words
The method of determining the concentration of an element according to claim 1 wherein the element is copper.
Claim 6
Independent Claim
87 words
A method of determining the unknown concentration of an element in a compound comprising: a. forming a semiconductor electrode containing a known concentration of said element; b. providing a solution containing said element in unknown concentration in ionized form; c. immersing said semiconductor electrode and a reference electrode in the solution containing said element in ionized form; d. measuring the potential developed between said semiconductor electrode and said reference electrode; and e. deriving the concentration of said element in the solution containing said element from said potential.
Claim 7
Independent Claim
87 words
A method of determining the unknown concentration of an element in a compound comprising: a. forming a semiconductor electrode containing a known concentration of said element; b. providing a solution containing said element in unknown concentration in ionized form; c. immersing said semiconductor electrode and a reference electrode in the solution containing said element in ionized form; d. measuring the potential developed between said semiconductor electrode and said reference electrode; and e. deriving the concentration of said element in the solution containing said element from said potential.
Claim 8
Dependent Claim
11 words
The method of claim 1 wherein said semiconductor material is silicon.
Claim 9
Dependent Claim
11 words
The method of claim 5 wherein said semiconductor material is silicon.
Claim 10
Dependent Claim
42 words
The method of determining the concentration of an element according to claim 5 wherein the step of diffusing the element is carried out by coating the body of semi-conductor material with a compound including the element and then heating the coated body.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-07-15 | 1978-01-14 | 1978-07-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-07-15 | 1982-01-14 | 1982-07-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-07-15 | 1986-01-14 | 1986-07-16 | $7700.00 | Window Closed / Lapsed |