Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
135 words
A method of propagation delay testing a single-sided delay dependent functional logic unit having primary inputs and primary outputs and formed of combinational networks and sets of associated sequential circuits having access for scanning independent of said primary inputs and outputs, comprising the steps of selecting a predetermined path through at least a portion of said unit for test sensitization, initializing the states of said sets of circuits, applying a test pattern to at least Some of said primary inputs for said selected path, altering one of said primary inputs to the selected path, and measuring the output of said selected path for a change of state after a given period of time has elapsed from the altering of the primary input, whereby an indication of the propagation delay through the selected path is obtained.
Claim 2
Independent Claim
135 words
A method of propagation delay testing a single-sided delay dependent functional logic unit having primary inputs and primary outputs and formed of combinational networks and sets of associated sequential circuits having access for scanning independent of said primary inputs and outputs, comprising the steps of selecting a predetermined path through at least a portion of said unit for test sensitization, initializing the states of said sets of circuits, applying a test pattern to at least Some of said primary inputs for said selected path, altering one of said primary inputs to the selected path, and measuring the output of said selected path for a change of state after a given period of time has elapsed from the altering of the primary input, whereby an indication of the propagation delay through the selected path is obtained.
Claim 3
Dependent Claim
28 words
The method of claim 1, wherein initialization of the states of said set is accomplished by scanning a predetermined signal pattern into said sets through said scanning access.
Claim 4
Dependent Claim
29 words
The method of claim 2, wherein the method is repeated a plurality of times by selecting a plurality of paths and applying a plurality of test patterns in sequence.
Claim 5
Dependent Claim
33 words
The method of claim 2, wherein the output of the sensitized path is a primary output of the unit and the measuring is performed directly by observing any change in a primary output.
Claim 6
Dependent Claim
39 words
The method of claim 4, wherein the sensitized path commences at the primary inputs and passes through a combinational network and the direct measurement is made a given time after effecting an alteration in one of the primary inputs.
Claim 7
Dependent Claim
64 words
The method of claim 4, wherein some of said primary inputs are clock trains coupled respectively to the sets of sequential circuits and the sensitized path commences in a set of said sequential circuits and passes through a combinational network and the direct measurement is made a given time after effecting a change in the clock train for the set where the path commences.
Claim 8
Dependent Claim
80 words
The method of claim 3, wherein some of said primary inputs are clock trains coupled respectively to the sets of sequential circuits and the output of the sensitized path is in one of the sets of said sequential circuits and the measuring is performed by effecting a change in the clock train for the set having the output of said path and there-after scanning out the contents of said set for obtaining an indication of a change in said set.
Claim 9
Dependent Claim
48 words
The method of claim 7, wherein the sensitized path commences at the primary inputs and passes through a combinational network to said set of sequential circuits and the altering of the primary input occurs a predetermined period of time before a change is effected in the clock train.
Claim 10
Dependent Claim
63 words
The method of claim 7, wherein the sensitized path commences at one set of sequential circuits and passes through a combinational network to the output of said path in another set of said circuits and the altering of the primary input is accomplished by changing the clock train for the one set of circuits a predetermined period of time prior to the measuring.