US3517191A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Scanning ion microscope with magnetic sector lens to purify the primary ion beam
Assignee: HELMUT J LIEBL
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Filing: 1965-10-11
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Granted: 1970-06-23
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Expires: 1985-10-11
Abstract
No abstract record available.
Inventors
- 👤 Helmut J Liebl
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 18:33
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/30; H01J29/00; H01J29/46; H01J29/58; H01J37/00; H01J37/02; H01J37/04; H01J37/05; H01J37/252; H01J37/256; H01J49/02; H01J49/022; H01J49/10; H01J49/14; H01J49/142; H01J49/20; H01J49/284; H01J49/286; H01J49/32; H01J49/322
Claims Analysis
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References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1973-06-22 | 1973-12-22 | 1974-06-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1977-06-22 | 1977-12-22 | 1978-06-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1981-06-22 | 1981-12-22 | 1982-06-23 | $7700.00 | Window Closed / Lapsed |