US3103584A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electron microanalyzer system
Assignee: —
•
Filing: —
•
Granted: 1963-09-10
•
Expires: 1980-09-10
Abstract
No abstract record available.
Inventors
No inventors recorded.
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 19:17
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/252; H01J37/256
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
68 words
AN ELECTRON BEAM ANALYSIS SYSTEM COMPRISING MEANS FOR DIRECTING AN ELECTRON BEAM TO A SPECIMEN, AND MEANS FOR BIASING THE SPECIMEN AND FOR DERIVING A SIGNAL IN ACCORDANCE WITH SPECIMEN CURRENT PRODUCED BY SAID BEAM INCLUDING A SAMPLING IMPEDANCE HAVING A TERMINAL TO RECEIVE SAID SPECIMEN CURRENT, AND MEANS FOR DERIVING AN ATOMIC NUMBER SIGNAL FROM THE VOLTAGE AT SAID IMPEDANCE TERMINAL AND INCLUDING A FEEDBACK CIRCUIT FOR
Claim 2
Dependent Claim
68 words
AN ELECTRON BEAM ANALYSIS SYSTEM COMPRISING MEANS FOR DIRECTING AN ELECTRON BEAM TO A SPECIMEN, AND MEANS FOR BIASING THE SPECIMEN AND FOR DERIVING A SIGNAL IN ACCORDANCE WITH SPECIMEN CURRENT PRODUCED BY SAID BEAM INCLUDING A SAMPLING IMPEDANCE HAVING A TERMINAL TO RECEIVE SAID SPECIMEN CURRENT, AND MEANS FOR DERIVING AN ATOMIC NUMBER SIGNAL FROM THE VOLTAGE AT SAID IMPEDANCE TERMINAL AND INCLUDING A FEEDBACK CIRCUIT FOR
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1966-09-09 | 1967-03-11 | 1967-09-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1970-09-09 | 1971-03-11 | 1971-09-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1974-09-09 | 1975-03-11 | 1975-09-10 | $7700.00 | Window Closed / Lapsed |