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US3471778A
Expired / Lapsed
US
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Method of testing an ordered,multi-element electrical circuit array including connecting certain elements in common
Assignee: International Business Machines Corp
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Filing: 1967-01-13
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Granted: 1969-10-07
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Expires: 1987-01-13
Abstract
No abstract record available.
Inventors
- 👤 Jack Plymette Bennett
- 👤 David Gordon
- 👤 Myron Martin Kutcher
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 12:36
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31917
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-10-06 | 1973-04-07 | 1973-10-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-10-06 | 1977-04-07 | 1977-10-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-10-06 | 1981-04-07 | 1981-10-07 | $7700.00 | Window Closed / Lapsed |