US3345221A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of making a semiconductor device having improved pn junction avalanche characteristics
Assignee: Motorola Solutions Inc
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Filing: 1963-04-10
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Granted: 1967-10-03
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Expires: 1983-04-10
Abstract
No abstract record available.
Inventors
- 👤 Lesk Israel Arnold
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 16:49
CPC Classifications
H; H10; H10D; H10D8/00; H10D8/20; H10D8/25; H10D99/00; H10P; H10P95/00; H10W; H10W15/00; H10W15/01; Y; Y10; Y10S; Y10S148/00; Y10S148/035
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
190 words
A METHOD OF MAKING A RECTIFYING JUNCTION IN A SEMICONDUCTOR BODY SO THAT AVALANCHE BREAKDOWN OF SAID JUNCTION TENDS TO OCCUR BENEATH THE SURFACE OF SAID BODY, SAID METHOD COMPRISING, EPITAXIALLY GROWING ON A SURFACE OF A SEMICONDUCTOR CRYSTAL OF ONE CONDUCTIVITY TYPE A SEMICONDUCTOR LAYER OF THE SAME CONDUCTIVITY TYPE AS SAID CRYSTAL BUT OF HIGHER RESISTIVITY THAN THE UNDERLYING CRYSTAL MATERIAL, AND SELECTIVELY DIFFUSING AN IMPURITY OF OPPOSITE CONDUCTIVITY TYPE TO FORM A SEMICONDUCTOR REGION EXTENDING THROUGH ONLY A PORTION OF SAID LAYER TO DEFINE A RECTIFYING JUNCTION EXTENDING FROM BENEATH SAID LAYER TO FORM A REGION OF OPPOSITE CONDUCTIVITY SEMICONDUCTOR MATERIAL DEFINING A RECTIFYING JUNCTION WHICH EXTENDS CONTINUOUSLY WITHIN THE BULK OF SAID CRYSTAL AND BETWEEN SAID OPPOSITE CONDUCTIVITY REGION AND SAID SEMICONDUCTOR CRYSTAL AND THROUGH SAID SEMICONDUCTOR SURFACE LAYER OF HIGHER RESISTIVITY TO THE SURFACE OF SAID BODY WHEREBY THE PORTION OF SAID RECTIFYING JUNCTION BOUNDED BY SAID UNDERLYING SEMICONDUCTOR CRYSTAL OF SAID ONE CONDUCTIVITY TYPE AND BY SAID OPPOSITE CONDUCTIVITY REGION WILL BREAK DOWN AT A LOWER REVERSE VOLTAGE THAN THE PORTION OF SAID RECTIFYING JUNCTION BOUNDED BY SAID SEMICONDUCTOR SURFACE LAYER OF HIGHER RESISTIVITY.
Claim 2
Independent Claim
190 words
A METHOD OF MAKING A RECTIFYING JUNCTION IN A SEMICONDUCTOR BODY SO THAT AVALANCHE BREAKDOWN OF SAID JUNCTION TENDS TO OCCUR BENEATH THE SURFACE OF SAID BODY, SAID METHOD COMPRISING, EPITAXIALLY GROWING ON A SURFACE OF A SEMICONDUCTOR CRYSTAL OF ONE CONDUCTIVITY TYPE A SEMICONDUCTOR LAYER OF THE SAME CONDUCTIVITY TYPE AS SAID CRYSTAL BUT OF HIGHER RESISTIVITY THAN THE UNDERLYING CRYSTAL MATERIAL, AND SELECTIVELY DIFFUSING AN IMPURITY OF OPPOSITE CONDUCTIVITY TYPE TO FORM A SEMICONDUCTOR REGION EXTENDING THROUGH ONLY A PORTION OF SAID LAYER TO DEFINE A RECTIFYING JUNCTION EXTENDING FROM BENEATH SAID LAYER TO FORM A REGION OF OPPOSITE CONDUCTIVITY SEMICONDUCTOR MATERIAL DEFINING A RECTIFYING JUNCTION WHICH EXTENDS CONTINUOUSLY WITHIN THE BULK OF SAID CRYSTAL AND BETWEEN SAID OPPOSITE CONDUCTIVITY REGION AND SAID SEMICONDUCTOR CRYSTAL AND THROUGH SAID SEMICONDUCTOR SURFACE LAYER OF HIGHER RESISTIVITY TO THE SURFACE OF SAID BODY WHEREBY THE PORTION OF SAID RECTIFYING JUNCTION BOUNDED BY SAID UNDERLYING SEMICONDUCTOR CRYSTAL OF SAID ONE CONDUCTIVITY TYPE AND BY SAID OPPOSITE CONDUCTIVITY REGION WILL BREAK DOWN AT A LOWER REVERSE VOLTAGE THAN THE PORTION OF SAID RECTIFYING JUNCTION BOUNDED BY SAID SEMICONDUCTOR SURFACE LAYER OF HIGHER RESISTIVITY.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1970-10-02 | 1971-04-03 | 1971-10-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1974-10-02 | 1975-04-03 | 1975-10-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1978-10-02 | 1979-04-03 | 1979-10-03 | $7700.00 | Window Closed / Lapsed |