Patent US2547212A successfully refreshed from Google Patents.
US2547212A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for determining the composition of a substance
Assignee: Philips Laboratories Inc
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Filing: 1948-01-17
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Granted: 1951-04-03
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Expires: 1968-01-17
Abstract
No abstract record available.
Inventors
- 👤 Noel C Jamison
- 👤 Otto G Koppius
- 👤 Thomas R Kohler
- 👤 James G Black
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 10:22
CPC Classifications
G; G01; G01J; G01J3/00; G01J3/28; G01J3/42
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
226 words
AN INFRA-RED ANALYZER COMPRISING A FIRST CONCAVE SPHERICAL MIRROR, A SOURCE OF INFRA-RED RADIATION POSITIONED AT THE FOCAL POINT OF SAID FIRST SPHERICAL MIRROR, THE RAYS FROM A COMMON AREA IN SAID SOURCE BEING CAST ON SAID FIRST SPHERICAL MIRROR AND BEING REFLECTED THEREBY AS A SUBSTANTIALLY COLLIMATED MAIN BEAM, A FIRST DOUBLE SURFACE REFLECTOR DISPOSED IN THE PATH OF SAID MAIN BEAM AND ARRANGED TO SPLIT SAID MAIN BEAM INTO SEPARATE FIRST AND SECOND ANALYZING BEAMS OF EQUAL INTENSITY, FIRST AND SECOND CELLS FOR CONTAINING AN UNKNOWN SAMPLE OF A SUBSTANCE BEING TESTED AND A STANDARD SAMPLE RESPECTIVELY, SAID CELL HAVING FRONT AND BACK WINDOWS PERMITTING THE PASSAGE THERETHROUGH OF RADIATION, A SECOND CONCAVE SPHERICAL MIRROR, A BOLOMETER DISPOSED AT THE FOCAL POINT OF SAID SECOND SPHERICAL MIRROR, A SECOND DOUBLE SURFACE REFLECTOR, MEANS FOR DIRECTING SAID FIRST ANALYZING BEAM FROM ONE SURFACE OF SAID FIRST DOUBLE REFLECTOR THROUGH SAID FIRST CELL AND ONTO ONE SURFACE OF SAID SECOND DOUBLE REFLECTOR, MEANS FOR DIRECTING SAID SECOND ANALYZING BEAM FROM THE OTHER SURFACE OF SAID FIRST DOUBLE REFLECTOR THROUGH SAID SECOND CELL AND ONTO THE OTHER SURFACE OF SAID SECOND DOUBLE REFLECTOR, SAID SECOND DOUBLE REFLECTOR BEING ARRANGED TO PROJECT SAID FIRST AND SECOND ANALYZING BEAMS IN PARALLEL PATHS ONTO SAID SECOND SPHERICAL MIRROR WHEREBY SAID FIRST AND SECOND ANALYZAING BEAMS ARE CONCENTRATED ON SAID BOLOMETER,
Claim 2
Dependent Claim
226 words
AN INFRA-RED ANALYZER COMPRISING A FIRST CONCAVE SPHERICAL MIRROR, A SOURCE OF INFRA-RED RADIATION POSITIONED AT THE FOCAL POINT OF SAID FIRST SPHERICAL MIRROR, THE RAYS FROM A COMMON AREA IN SAID SOURCE BEING CAST ON SAID FIRST SPHERICAL MIRROR AND BEING REFLECTED THEREBY AS A SUBSTANTIALLY COLLIMATED MAIN BEAM, A FIRST DOUBLE SURFACE REFLECTOR DISPOSED IN THE PATH OF SAID MAIN BEAM AND ARRANGED TO SPLIT SAID MAIN BEAM INTO SEPARATE FIRST AND SECOND ANALYZING BEAMS OF EQUAL INTENSITY, FIRST AND SECOND CELLS FOR CONTAINING AN UNKNOWN SAMPLE OF A SUBSTANCE BEING TESTED AND A STANDARD SAMPLE RESPECTIVELY, SAID CELL HAVING FRONT AND BACK WINDOWS PERMITTING THE PASSAGE THERETHROUGH OF RADIATION, A SECOND CONCAVE SPHERICAL MIRROR, A BOLOMETER DISPOSED AT THE FOCAL POINT OF SAID SECOND SPHERICAL MIRROR, A SECOND DOUBLE SURFACE REFLECTOR, MEANS FOR DIRECTING SAID FIRST ANALYZING BEAM FROM ONE SURFACE OF SAID FIRST DOUBLE REFLECTOR THROUGH SAID FIRST CELL AND ONTO ONE SURFACE OF SAID SECOND DOUBLE REFLECTOR, MEANS FOR DIRECTING SAID SECOND ANALYZING BEAM FROM THE OTHER SURFACE OF SAID FIRST DOUBLE REFLECTOR THROUGH SAID SECOND CELL AND ONTO THE OTHER SURFACE OF SAID SECOND DOUBLE REFLECTOR, SAID SECOND DOUBLE REFLECTOR BEING ARRANGED TO PROJECT SAID FIRST AND SECOND ANALYZING BEAMS IN PARALLEL PATHS ONTO SAID SECOND SPHERICAL MIRROR WHEREBY SAID FIRST AND SECOND ANALYZAING BEAMS ARE CONCENTRATED ON SAID BOLOMETER,
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1954-04-02 | 1954-10-02 | 1955-04-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1958-04-02 | 1958-10-02 | 1959-04-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1962-04-02 | 1962-10-02 | 1963-04-03 | $7700.00 | Window Closed / Lapsed |