US5410261A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor device testing apparatus
Assignee: Sumitomo Electric Industries Ltd
•
Filing: 1992-07-07
•
Granted: 1995-04-25
•
Expires: 2012-07-07
Abstract
Abstract A testing apparatus which assures that a constant acceleration test and an AC continuous operation test can be simultaneously conducted on semiconductor devices to be tested. The testing apparatus includes a rotatable turntable with semiconductor devices to be tested mounted thereon, rotary terminals electrically connected to connection pins of the semiconductor devices mounted on the turntable and adapted to rotate together with the turntable, and stationary terminals adapted to intermittently or continuously slidably contact the rotary terminals while the turntable is rotated.
Inventors
- 👤 Tatsuya Hashinaga
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 16:23
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/2872; G01R31/2881
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
161 words
A semiconductor device testing apparatus for concurrently conducting an AC continuous operation test and a constant acceleration test, comprising: a turntable that rotates so as to provide a substantially constant rotational acceleration to a semiconductor device that has connection pins; holding means, secured to said turntable, for firmly holding said semiconductor device, and for providing an electrical connection to a selected one of said connection pins; a rotary terminal secured to said turntable, and electrically connected to said holding means, thereby providing an electrical connection between said rotary terminal and said selected one of said connection pins; and a stationary terminal, which becomes intermittently electrically connected, due to said rotation of said turntable, to said rotary terminal, said stationary terminal electrically connected to an independent DC power supply; wherein said intermittent electrical connection of said rotary terminal and said stationary terminal creates a pulsating current in said rotary terminal while said substantially constant rotational acceleration of said semiconductor device is occurring.
Claim 2
Dependent Claim
161 words
A semiconductor device testing apparatus for concurrently conducting an AC continuous operation test and a constant acceleration test, comprising: a turntable that rotates so as to provide a substantially constant rotational acceleration to a semiconductor device that has connection pins; holding means, secured to said turntable, for firmly holding said semiconductor device, and for providing an electrical connection to a selected one of said connection pins; a rotary terminal secured to said turntable, and electrically connected to said holding means, thereby providing an electrical connection between said rotary terminal and said selected one of said connection pins; and a stationary terminal, which becomes intermittently electrically connected, due to said rotation of said turntable, to said rotary terminal, said stationary terminal electrically connected to an independent DC power supply; wherein said intermittent electrical connection of said rotary terminal and said stationary terminal creates a pulsating current in said rotary terminal while said substantially constant rotational acceleration of said semiconductor device is occurring.
Claim 3
Dependent Claim
17 words
An apparatus as in claim 1, wherein said turntable is cylindrical and surrounded by an annular drum.
Claim 4
Dependent Claim
16 words
An apparatus as in claim 2, wherein said annular drum is joined with said stationary terminal.
Claim 5
Dependent Claim
18 words
An apparatus as in claim 1, wherein a cylindrical drum is surrounded by said turntable which is annular.
Claim 6
Dependent Claim
16 words
An apparatus as in claim 4, wherein said cylindrical drum is joined with said stationary terminal.
Claim 7
Dependent Claim
15 words
An apparatus as in claim 1, wherein said power supply is a DC power supply.
Claim 8
Independent Claim
79 words
A method for concurrently performing an AC continuous operation test and a constant acceleration test on a semiconductor device having connection pins comprising the steps of: a) firmly attaching said semiconductor device to a holder; b) rotating said semiconductor device at a substantially constant rotational acceleration; and c) applying, concurrently with step (b), an alternating current to at least one of the connection pins so as to perform said AC continuous operation test while performing said constant acceleration test.
Claim 9
Independent Claim
79 words
A method for concurrently performing an AC continuous operation test and a constant acceleration test on a semiconductor device having connection pins comprising the steps of: a) firmly attaching said semiconductor device to a holder; b) rotating said semiconductor device at a substantially constant rotational acceleration; and c) applying, concurrently with step (b), an alternating current to at least one of the connection pins so as to perform said AC continuous operation test while performing said constant acceleration test.
Claim 10
Dependent Claim
33 words
A method as in claim 7, wherein said alternating current is generated by intermittently applying different independent DC power supplies to said at least one connection pin of said plurality of connection pins.
Claim 11
Independent Claim
111 words
An apparatus for concurrently performing an AC continuous operation test and a constant acceleration test on a semiconductor device having connection pins comprising: means for securely holding said semiconductor device; acceleration means for rotationally accelerating said holding means at a substantially constant magnitude; means for electrically connecting at least one of said connection pins to an edge of said acceleration means; means for supplying different independent DC power supplies; and means for intermittently connecting said different independent DC power supply means to said at least one of said connection pins, thereby creating an AC current so as to perform said AC continuous operation test while concurrently performing said constant acceleration test.
Claim 12
Independent Claim
111 words
An apparatus for concurrently performing an AC continuous operation test and a constant acceleration test on a semiconductor device having connection pins comprising: means for securely holding said semiconductor device; acceleration means for rotationally accelerating said holding means at a substantially constant magnitude; means for electrically connecting at least one of said connection pins to an edge of said acceleration means; means for supplying different independent DC power supplies; and means for intermittently connecting said different independent DC power supply means to said at least one of said connection pins, thereby creating an AC current so as to perform said AC continuous operation test while concurrently performing said constant acceleration test.
Claim 13
Independent Claim
98 words
A method for concurrently performing an AC continuous operation test and a constant acceleration test on a semiconductor device having a plurality of connection pins comprising the steps of: a) firmly attaching said semiconductor device to a holder; b) rotating said semiconductor device at a substantially constant rotational acceleration, thereby performing said constant acceleration test so as to allow a result gathering step of said constant acceleration test to be conducted; and c) applying, concurrently with step (b), an alternating current to at least one of the connection pins so as to perform said AC continuous operation test.
Claim 14
Independent Claim
98 words
A method for concurrently performing an AC continuous operation test and a constant acceleration test on a semiconductor device having a plurality of connection pins comprising the steps of: a) firmly attaching said semiconductor device to a holder; b) rotating said semiconductor device at a substantially constant rotational acceleration, thereby performing said constant acceleration test so as to allow a result gathering step of said constant acceleration test to be conducted; and c) applying, concurrently with step (b), an alternating current to at least one of the connection pins so as to perform said AC continuous operation test.
References Cited (Backward Citations)
SU165236A1
Cited
SU299045A1
Cited
US2773731A
Cited
US3544949A
Cited
SU477566A1
Cited
JPS57559A
Cited
US4532423A
Cited
JPS58218667A
Cited
US4871865A
Cited
US4807483A
Cited
JPS63118672A
Cited
US4816756A
Cited
JPS6484476A
Cited
JPH01295176A
Cited
JPH0235374A
Cited
US4999211A
Cited
US5143450A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-04-24 | 1998-10-24 | 1999-04-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-04-24 | 2002-10-24 | 2003-04-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-04-24 | 2006-10-24 | 2007-04-25 | $7700.00 | Window Closed / Lapsed |