← Back to Patent Explorer
US4990994A Expired / Lapsed US ⏱️ 0.0 years remaining

Electrode structure for silicon carbide semiconductors

Assignee: Sharp Corp
•
Filing: 1989-09-05
•
Granted: 1991-02-05
•
Expires: 2009-09-05
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract An electrode structure for a silicon carbide single-crystal semiconductor in which the surface of the silicon carbide single-crystal is laminated with a metal layer of titanium, aluminum, chromium or molybdenum, or with the metal layer and an electrically conductive protective layer formed over the metal layer to provide an ohmic electrode.

Inventors

  • 👤 Katsuki Furukawa
  • 👤 Akira Suzuki
  • 👤 Mitsuhiro Shigeta
  • 👤 Atsuko Uemoto

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 19:16
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/80; H10D62/83; H10D62/832; H10D62/8325; H10D64/00; H10D64/60; H10D64/62

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 67 words
In an electrode structure for a silicon carbide single-crystal semiconductor in which the surface of the silicon carbide single-crystal is laminated with an electrode layer, the improvement in which the silicon carbide single-crystal has surface irregularities and the electrode layer comprises a metal layer of titanium, chromium or molybdenum and an electrically conductive protective layer of aluminum, copper and/or nickel formed thereon, to provide an ohmic electrode.
Claim 2
Dependent Claim 67 words
In an electrode structure for a silicon carbide single-crystal semiconductor in which the surface of the silicon carbide single-crystal is laminated with an electrode layer, the improvement in which the silicon carbide single-crystal has surface irregularities and the electrode layer comprises a metal layer of titanium, chromium or molybdenum and an electrically conductive protective layer of aluminum, copper and/or nickel formed thereon, to provide an ohmic electrode.
Claim 3
Dependent Claim 25 words
The electrode structure of claim 1, wherein the silicon carbide single-crystal is an epitaxially grown single crystal having a cubic structure of the β type.
Claim 4
Dependent Claim 18 words
The electrode structure of claim 1, wherein the metal layer is from 200 to 800 Angstroms in thickness.
Claim 5
Dependent Claim 20 words
The electrode structure of claim 1, wherein the electrically conductive protective layer is from 1000 to 3000 Angstroms in thickness.
Claim 6
Dependent Claim 32 words
The electrode structure of claim 1, wherein the metal layer is from 200 to 800 Angstroms in thickness, and the electrically conductive protective layer is from 1000 to 3000 Angstroms in thickness.

References Cited (Backward Citations)

DE2028076A1 Cited
US4352120A Cited
US4571610A Cited
US4561010A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-02-04 1994-08-06 1995-02-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-02-04 1998-08-06 1999-02-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-02-04 2002-08-06 2003-02-05 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag