Method and apparatus for digital time domain reflectometry

Claim 1

A time domain reflectometer connected to a cable under test comprising: (a) pulse generator means for generating a test pulse to said cable under test; (b) voltage comparator means for comparing a voltage pulse representing a reflection of said test pulse with a predetermined bias value and for providing a detection signal if said voltage pulse exceeds said predetermined bias value; (c) bias generator means for providing high and low bias levels to said comparator means for establishing said predetermined bias value; (d) a counter; (e) register means responsive to said counter for recording the value of said counter; and (f) signal processing means for triggering said pulse generator means and for directing said register means to record the value of said counter means for determining the time elapsed between the generation of said test pulse and the providing of said detection signal, wherein said signal processing means further includes means for resetting said bias generator means to provide altered high and low bias levels when said counter reaches a predetermined maximum count without the occurrence of a voltage pulse which exceeds either the high or low bias value in said voltage comparator means, whereby the location of impedance mismatches along said cable under test may be determined.

Claim 3

A method of obtaining an impedance signature of a cable under a test comprising the steps of: (a) setting high and low bias values in a comparator circuit connected to said cable under test; (b) triggering a pulse generator for providing a test pulse to the cable under test and simultaneously triggering a counter; (c) comparing in said comparator circuit the reflected value of the test pulse with said bias values; (d) recording the time elapsed between the completion of step (b) and the completion of step (c) when the reflected value of the test pulse exceeds at least one of the bias values set in the comparator circuit; and (e) decreasing the high and low bias voltages in the comparator circuit when the counter has reached a predetermined maximum count without the occurrence of a reflected value of the test pulse which exceeds either of said bias voltages.

Claim 4

A method of obtaining an impedance signature of a cable under a test comprising the steps of: (a) setting high and low bias values in a comparator circuit connected to said cable under test; (b) triggering a pulse generator for providing a test pulse to the cable under test and simultaneously triggering a counter; (c) comparing in said comparator circuit the reflected value of the test pulse with said bias values; (d) recording the time elapsed between the completion of step (b) and the completion of step (c) when the reflected value of the test pulse exceeds at least one of the bias values set in the comparator circuit; and (e) decreasing the high and low bias voltages in the comparator circuit when the counter has reached a predetermined maximum count without the occurrence of a reflected value of the test pulse which exceeds either of said bias voltages.