Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
108 words
A planar semiconductor acceleration detecting device comprising a substrate of semiconductor material having an elongated v-shaped cavity therein, a v-shape cantilever beam arranged in said v-shaped cavity and depending from one end thereof for movement into and out of said cavity and movement from side to side in said cavity, electrodes of conductive material arranged on the sloping walls of said cavity and on the sloping walls of said beam, and an electronic circuitry coupled to said electrodes and arranged for indicating the degree of acceleration to which said device is subjected in terms of the instantaneous capacity between said electrodes in said cavity and on said beam.
Claim 2
Dependent Claim
108 words
A planar semiconductor acceleration detecting device comprising a substrate of semiconductor material having an elongated v-shaped cavity therein, a v-shape cantilever beam arranged in said v-shaped cavity and depending from one end thereof for movement into and out of said cavity and movement from side to side in said cavity, electrodes of conductive material arranged on the sloping walls of said cavity and on the sloping walls of said beam, and an electronic circuitry coupled to said electrodes and arranged for indicating the degree of acceleration to which said device is subjected in terms of the instantaneous capacity between said electrodes in said cavity and on said beam.
Claim 3
Dependent Claim
93 words
A planar semiconductor acceleration device as defined in claim 1, and wherein said electronic circuitry comprises an electric bridge circuit having four arms each comprising a capacitor with two arms comprising variable capacitors formed by the electrodes on the sloping walls of said cavity and on the sloping walls of said beam, an electric energizing potential source connected across one diagonal of said bridge circuit, a differential amplifier circuit having output terminals at which an indication of acceleration is delivered and differential input terminals coupled across the other diagonal of said bridge circuit.
Claim 4
Dependent Claim
78 words
A planar semiconductor acceleration device as defined in claim 2, and wherein said input terminals of said differential amplifier circuit are coupled across said bridge circuit by four field effect transistors connected to said capacitors as to vary the resistance in accordance with the variable capacitor connected between the gate electrode and the drain electrode in said two arms, thereby to unbalance said amplifier circuit in accordance with the degree of acceleration to which said device is subjected.
Claim 5
Dependent Claim
110 words
A planar semiconductor acceleration detecting device comprising an n-type silicon substrate having an elongated v-shaped cavity therein, electrodes of p+ boron diffused in the sloping walls of said circuitry, a v-shaped cantilever beam arranged in said v-shaped cavity and depending from one end thereof for movement into and out of said cavity and movement from side to side in said cavity, metal electrode material arranged on the sloping walls of said beam, and an electronic circuitry coupled to said electrodes and arranged for indicating the degree of acceleration to which said device is subjected in terms of the instantaneous capacity between said electrodes in said cavity and on said beam.
Claim 6
Dependent Claim
110 words
A planar semiconductor acceleration detecting device comprising an n-type silicon substrate having an elongated v-shaped cavity therein, electrodes of p+ boron diffused in the sloping walls of said circuitry, a v-shaped cantilever beam arranged in said v-shaped cavity and depending from one end thereof for movement into and out of said cavity and movement from side to side in said cavity, metal electrode material arranged on the sloping walls of said beam, and an electronic circuitry coupled to said electrodes and arranged for indicating the degree of acceleration to which said device is subjected in terms of the instantaneous capacity between said electrodes in said cavity and on said beam.
Claim 7
Dependent Claim
113 words
A planar semiconductor acceleration detecting device comprising an n-type silicon substrate having an elongated v-shaped cavity therein, electrodes of p+ boron diffused in the sloping walls of said circuitry, a thin-walled v-shaped cantilever beam SiO 2 arranged in said v-shaped cavity and depending from one end thereof for movement into and out of said cavity and movement from side to side in said cavity, conductive electrode material arranged on the sloping walls of said beam, and an electronic circuitry coupled to said electrodes and arranged for indicating the degree of acceleration to which said device is subjected in terms of the instantaneous capacity between said electrodes in said cavity and on said beam.
Claim 8
Dependent Claim
113 words
A planar semiconductor acceleration detecting device comprising an n-type silicon substrate having an elongated v-shaped cavity therein, electrodes of p+ boron diffused in the sloping walls of said circuitry, a thin-walled v-shaped cantilever beam SiO 2 arranged in said v-shaped cavity and depending from one end thereof for movement into and out of said cavity and movement from side to side in said cavity, conductive electrode material arranged on the sloping walls of said beam, and an electronic circuitry coupled to said electrodes and arranged for indicating the degree of acceleration to which said device is subjected in terms of the instantaneous capacity between said electrodes in said cavity and on said beam.
Claim 9
Independent Claim
150 words
A method of fabricating a planar semiconductor device having a cantilever beam arranged therein for movement in a direction parallel to the plane of said device, comprising the steps of: preparing a monocrystalline silicon wafer with the major surface lying in the (100) plane, anisotropically etching an elongated pyramidal cavity in said wafer from said major surface, doping sloping wall regions defining said cavity with a dopant of type opposite to the type of said wafer, growing an epitaxial layer over the major surface and the sloping walls of said cavity, depositing an insulating layer over all of said epitaxial layer, etching said insulating layer to define said cantilever beam over said cavity with the beam depending from one narrow end of the cavity, depositing a layer of conductive material over said insulating layer and delineating the pattern photolithographically, and anisotropically etching away the epitaxial layer from under said beam.
Claim 10
Independent Claim
150 words
A method of fabricating a planar semiconductor device having a cantilever beam arranged therein for movement in a direction parallel to the plane of said device, comprising the steps of: preparing a monocrystalline silicon wafer with the major surface lying in the (100) plane, anisotropically etching an elongated pyramidal cavity in said wafer from said major surface, doping sloping wall regions defining said cavity with a dopant of type opposite to the type of said wafer, growing an epitaxial layer over the major surface and the sloping walls of said cavity, depositing an insulating layer over all of said epitaxial layer, etching said insulating layer to define said cantilever beam over said cavity with the beam depending from one narrow end of the cavity, depositing a layer of conductive material over said insulating layer and delineating the pattern photolithographically, and anisotropically etching away the epitaxial layer from under said beam.
Claim 11
Independent Claim
148 words
A method of fabricating a planar semiconductor device having a cantilever beam arranged therein for movement in a direction parallel to the plane of said device, comprising the steps of: preparing an n-type monocrystalline silicon wafer with the major surface lying in the (100) plane, anisotropically etching an elongated pyramidal cavity in said wafer from said major surface, doping sloping wall regions defining said cavity with a dopant of p+ boron, growing an n-type epitaxial layer over the major surface and the sloping walls of said cavity, depositing an insulating layer of SiO 2 over all of said epitaxial layer, etching said insulating layer to define said cantilever beam over said cavity with the beam depending from one narrow end of the cavity, depositing a layer of aluminum over said insulating layer and delineating the pattern photolithographically, and anisotropically etching away the epitaxial layer from under said beam.
Claim 12
Independent Claim
148 words
A method of fabricating a planar semiconductor device having a cantilever beam arranged therein for movement in a direction parallel to the plane of said device, comprising the steps of: preparing an n-type monocrystalline silicon wafer with the major surface lying in the (100) plane, anisotropically etching an elongated pyramidal cavity in said wafer from said major surface, doping sloping wall regions defining said cavity with a dopant of p+ boron, growing an n-type epitaxial layer over the major surface and the sloping walls of said cavity, depositing an insulating layer of SiO 2 over all of said epitaxial layer, etching said insulating layer to define said cantilever beam over said cavity with the beam depending from one narrow end of the cavity, depositing a layer of aluminum over said insulating layer and delineating the pattern photolithographically, and anisotropically etching away the epitaxial layer from under said beam.
Claim 13
Dependent Claim
50 words
A method of fabricating a planar semiconductor device as defined in claim 7, and incorporating the step of: processing said wafer, after depositing said insulating layer, for defining field effect transistor, capacitors, resistors and the like for interconnection as electronic circuitry for indicating the degree of acceleration and the like.
Claim 14
Dependent Claim
131 words
A planar semiconductor acceleration detecting device, comprising a substrate of semiconductor material having two elongated v-shaped cavities therein arranged with the longitudinal axes at 90° with respect to each other, a v-shaped cantilever beam arranged in each of said v-shaped cavities and depending from one end thereof for movement from side to side in said cavity, electrodes of conductive material arranged on the sloping walls of said cavities and on the sloping walls of said beams, and an electronic circuitry coupled to said electrodes and arranged for indicating the degree of acceleration to which said device is subjected in terms of the instantaneous capacity between said electrodes in said cavities and on the respective beams, thereby to indicate acceleration components in two directions substantially parallel to the plane of said substrate.
Claim 15
Dependent Claim
131 words
A planar semiconductor acceleration detecting device, comprising a substrate of semiconductor material having two elongated v-shaped cavities therein arranged with the longitudinal axes at 90° with respect to each other, a v-shaped cantilever beam arranged in each of said v-shaped cavities and depending from one end thereof for movement from side to side in said cavity, electrodes of conductive material arranged on the sloping walls of said cavities and on the sloping walls of said beams, and an electronic circuitry coupled to said electrodes and arranged for indicating the degree of acceleration to which said device is subjected in terms of the instantaneous capacity between said electrodes in said cavities and on the respective beams, thereby to indicate acceleration components in two directions substantially parallel to the plane of said substrate.
Claim 16
Dependent Claim
45 words
A planar semiconductor acceleration detecting device as described in claim 9, and incorporating a third v-shaped cavity and v-shaped beam assembly and electrodes therefor, and electronic circuitry coupled to the electrodes for determining the acceleration in a direction normal to the plane of said substrate.