US4331026A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Indenter-type hardness testing apparatus
Assignee: Boeing Co
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Filing: 1980-07-14
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Granted: 1982-05-25
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Expires: 2000-07-14
Abstract
Abstract A material hardness testing apparatus is provided, for use in quality control of production materials and parts, in which a pneumatically actuated indenter probe, incorporating an LVDT displacement transducer, is coupled by an analog-to-digital converter to a microprocessor-based computer that controls the cyclic actuation of the indentor probe, and processes indenter measurement data received from the LVDT transducer. The pneumatically actuated indenter probe includes pneumatic control means for providing independently adjustable control over the rates of probe impact and retraction in order to achieve consistent hardness measurements from cycle to cycle, together with relatively rapid displacement cycling of the indenter probe. The microprocessor-based computer incorporates a recalibration processor which automatically causes the testing apparatus to branch into a recalibration routine after a predetermined period of operation. During such recalibration, the apparatus semi-automatically tests and compares the measured hardness of one or more reference specimens with hardness values stored in memory and either disables the testing apparatus when the measured hardness deviates from the standard by a predetermined percentage amount, or stores in memory the difference between the measured hardness and the standard and enables the apparatus to continue with further testing. In each succeeding test, the apparatus automatically subtracts or adds the magnitude of the memorized difference to the raw measured hardness value to correct the hardness reading displayed by the apparatus.
Inventors
- 👤 Bruce S. Howard
- 👤 William O. Walters
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 18:57
CPC Classifications
G; G01; G01N; G01N3/00; G01N3/40; G01N3/42; G01N2203/00; G01N2203/0098; G01N2203/02; G01N2203/0202; G01N2203/021
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
265 words
In a hardness testing apparatus of the type having an indenter probe and a probe actuator for controllably moving said probe into and out of contact with a test part to thereby cause said probe to deformably penetrate the test part, and having sensing transducer means for producing an electrical signal representing the degree of such penetration as a measure of the hardness of the test part, the improvement in signal processing circuitry of such hardness testing apparatus comprising: reset means; indicator means responsive to said reset means for indicating a calibration mode; and, calibration processor means responsive to actuation of said probe by said actuator, said calibration processor means comprising: calibration measuring processor means for developing a signal measurement representing the measured hardness of a calibrating material when such a calibrating material is contacted by said probe; difference taking processor means for taking the difference between said measurement signal and a stored hardness signal representing the known hardness of said calibrating material, and for developing a calibration error signal in response thereto; comparison processor means for comparing said error signal with a predetermined threshold; automatic error correcting processor means responsive to said comparison means when said error signal is less than said predetermined threshold for storing said error signal for automatically correcting subsequent hardness measurements of parts of unknown hardness; and, recalibration disablement processor means responsive to said comparison processor means when said error signal is greater than said predetermined threshold for disabling said apparatus from further testing, said disablement processor means including means for reenabling said apparatus in response to said reset means.
Claim 2
Dependent Claim
265 words
In a hardness testing apparatus of the type having an indenter probe and a probe actuator for controllably moving said probe into and out of contact with a test part to thereby cause said probe to deformably penetrate the test part, and having sensing transducer means for producing an electrical signal representing the degree of such penetration as a measure of the hardness of the test part, the improvement in signal processing circuitry of such hardness testing apparatus comprising: reset means; indicator means responsive to said reset means for indicating a calibration mode; and, calibration processor means responsive to actuation of said probe by said actuator, said calibration processor means comprising: calibration measuring processor means for developing a signal measurement representing the measured hardness of a calibrating material when such a calibrating material is contacted by said probe; difference taking processor means for taking the difference between said measurement signal and a stored hardness signal representing the known hardness of said calibrating material, and for developing a calibration error signal in response thereto; comparison processor means for comparing said error signal with a predetermined threshold; automatic error correcting processor means responsive to said comparison means when said error signal is less than said predetermined threshold for storing said error signal for automatically correcting subsequent hardness measurements of parts of unknown hardness; and, recalibration disablement processor means responsive to said comparison processor means when said error signal is greater than said predetermined threshold for disabling said apparatus from further testing, said disablement processor means including means for reenabling said apparatus in response to said reset means.
Claim 3
Dependent Claim
60 words
The hardness testing apparatus of claim 1 wherein said signal processing circuitry further comprises timing processor means responsive to said reset means for disabling said circuitry at the end of a predetermined calibration check period, said timing processor means maintaining said circuitry in a disabled state until reset by said reset means which thereby initiates a succeeding recalibration check period.
Claim 4
Dependent Claim
77 words
The hardness testing apparatus of claim 1 wherein said signal processing circuitry comprises a microprocessor-based computer incorporating said calibration processor means, and further comprising hardness testing processor means responsive to said automatic error correcting processor means of said calibration processor means for cooperating with said probe so as to measure the unknown hrdness of test parts, and recalibration interrupt processor means for disabling said hardness testing processor means at the end of a predetermined calibration check period.
Claim 5
Dependent Claim
70 words
The hardness testing apparatus of claim 1 wherein said probe actuator comprises: electro-mechanical means responsive to a control signal for driving said probe into contact with a test part in an impact stroke and then retracting said probe from such test part in a retraction stroke, said electro-mechanical means comprising means for independently adjusting the rates of movement of said probe in said impact stroke and in said retraction stroke.
Claim 6
Dependent Claim
64 words
The apparatus of claim 4 wherein said electro-mechanical means comprises an electrical signal piloted fluid control means having a first flow control valve means for adjusting the rate of said impact stroke of said probe and a second flow control valve means for adjusting the rate of said retraction strobe of said probe, said first and second flow control valve means being independently adjustable.
Claim 7
Dependent Claim
63 words
The hardness testing apparatus of claim 1 wherein said probe actuator comprises a fluid operated cylinder means to which said probe is supportively joined and further comprising support means for said probe and probe actuator, and probe position adjustment means adjustably connecting said cylinder means to said support means for adjustably positioning said probe actuator and said probe relative to a test part.
Claim 8
Dependent Claim
27 words
The hardness testing apparatus of claim 6 wherein said cylinder means includes a piston and said probe being fixedly joined to said piston for controlled reciprocation therewith.
Claim 9
Dependent Claim
18 words
The hardness testing apparatus of claim 7 wherein said position adjustment means comprises a manually rotatable screw means.
Claim 10
Dependent Claim
51 words
The apparatus of claim 6 wherein said support means comprises first and second spaced apart portions, said cylinder means being joined to said first portion by said position adjustment means and probe guide means mounted on said second portion for slidably guiding said probe in controlled reciprocation by said cylinder means.
Claim 11
Dependent Claim
272 words
A hardness testing apparatus comprising: an indenter probe means; a probe actuator means for controllably moving said probe means into and out of contact with a test part to thereby cause said probe means to deformably penetrate the test part; sensing transducer means for producing an electrical signal representing the degree of such penetration by said probe means as a measure of the hardness of the test part; hardness testing processor means responsive to said probe actuator means and said sensing transducer means for developing a measurement signal representing the hardness of a test part; manually operated reset means; p1 calibration processor means responsive to said reset means and to said probe actuator means and to said sensing transducer means, said calibration processor means comprising: calibration measuring processor means for developing a calibration measurement signal representing the measured hrdness of a calibrating material when such a calibrating material is contacted by said probe means; difference taking processor means for taking the difference between said calibration measurement signal and a stored hardness signal representing the known hardness of said calibrating material, and for developing a calibration error signal in response thereto; comparison processor means for comparing said error signal with a predetermined threshold; automatic error correcting processor means responsive to said comparison processor means, said automatic error correcting processor means storing said error signal for automatically correcting subsequent hardness measurements by said hardness testing processor means when said error signal is less than said predetermined threshold; and, disablement processor means responsive to said comparison processor means for disabling said hardness testing processor means when said error signal is greater than said predetermined threshold.
Claim 12
Dependent Claim
272 words
A hardness testing apparatus comprising: an indenter probe means; a probe actuator means for controllably moving said probe means into and out of contact with a test part to thereby cause said probe means to deformably penetrate the test part; sensing transducer means for producing an electrical signal representing the degree of such penetration by said probe means as a measure of the hardness of the test part; hardness testing processor means responsive to said probe actuator means and said sensing transducer means for developing a measurement signal representing the hardness of a test part; manually operated reset means; p1 calibration processor means responsive to said reset means and to said probe actuator means and to said sensing transducer means, said calibration processor means comprising: calibration measuring processor means for developing a calibration measurement signal representing the measured hrdness of a calibrating material when such a calibrating material is contacted by said probe means; difference taking processor means for taking the difference between said calibration measurement signal and a stored hardness signal representing the known hardness of said calibrating material, and for developing a calibration error signal in response thereto; comparison processor means for comparing said error signal with a predetermined threshold; automatic error correcting processor means responsive to said comparison processor means, said automatic error correcting processor means storing said error signal for automatically correcting subsequent hardness measurements by said hardness testing processor means when said error signal is less than said predetermined threshold; and, disablement processor means responsive to said comparison processor means for disabling said hardness testing processor means when said error signal is greater than said predetermined threshold.
Claim 13
Dependent Claim
68 words
The hardness testing apparatus of claim 10 further comprising timing processor means responsive to said reset means for starting a predetermined calibration check period, said timing processor means including means for disabling said hardness testing processor means at the end of said predetermined calibration check period, said timing processor means maintaining said hardness testing processor means in a disabled state until reset in response to said reset means.
Claim 14
Dependent Claim
34 words
The hardness testing apparatus of claim 11 wherein said hardness testing processor means comprises circuitry in a programmed microprocessor-based computer, and wherein said timing processor means comprises an interrupt processor of said microprocessor-based computer.
Claim 15
Dependent Claim
52 words
The hardness testing apparatus of claim 10 further comprising test actuating switch means adapted to be operated when a test part is disposed so as to be contacted by said probe means, and wherein said probe actuator means and said hardness testing processor means are responsive to said test actuating switch means.
Claim 16
Dependent Claim
80 words
The hardness testing apparatus of claim 13 further comprising delay circuit means connected in circuit with said test actuating switch means and said hardness testing processor means, said delay circuit means delaying operation of said hardness testing processor means for a predetermined delay interval following operation of said test actuating switch means, whereby a hardness measurement signal is developed by said hardness testing processor means only after said probe means has stabilized following an initial impact with a test part.
Claim 17
Dependent Claim
24 words
The apparatus of claim 10 further comprising indicator means responsive to said reset means and said calibration processor means for indicating a calibration mode.
Claim 18
Dependent Claim
50 words
The apparatus set forth in claim 10 further comprising sequence processor means for enabling said hardness testing processor means only after said comparison processor means and said automatic error correcting processor means of said calibration processor means has responded to an error signal that is less than said predetermined threshold.
Claim 19
Dependent Claim
89 words
The hardness testing apparatus of claim 10 further comprising: limit selector means for selecting a predetermined limit of hardness against which a measured hardness signal is to be compared; limit comparison processor means associated with said hardness testing processor means for comparing a hardness measurement signal with a limit selected by said limit selector means; and, alarm means responsive to said limit comparison processor means for signaling an alarm condition in response to a measurement hardness signal that falls outside of a limit selected by said limit selector means.
Claim 20
Dependent Claim
53 words
The hardness testing apparatus of claim 10 further comprising a tested parts counting processor means and an associated count display means, said tested parts counter processing means being responsive to said hardness testing processor means for accumulating a count in response to each hardness measurement signal developed by said hardness measurement processor means.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-05-24 | 1985-11-23 | 1986-05-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-05-24 | 1989-11-23 | 1990-05-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-05-24 | 1993-11-23 | 1994-05-25 | $7700.00 | Window Closed / Lapsed |