US4190759A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Processing of photomask
Assignee: Hitachi Ltd
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Filing: 1978-07-06
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Granted: 1980-02-26
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Expires: 1998-07-06
Abstract
Abstract A laser beam of a pulse width 10 to 20 nanoseconds is irradiated and scanned relatively and two-dimensionally on a metal thin film formed on a transparent substrate from the transparent substrate side and through the transparent substrate with a superposition number of laser beam spots set up to at most 15 and to thereby remove a predetermined region of the metal thin film. The irradiated metal film begins to melt from the substrate side and is removed away explosively from the substrate, leaving the substrate substantially unaffected.
Inventors
- 👤 Mikio Hongo
- 👤 Junichi Nakabayashi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 09:14
CPC Classifications
B; B23; B23K; B23K26/00; B23K26/08; B23K26/082; B23K26/083; B23K26/0853; B23K26/50; B23K26/57; G; G03; G03F; G03F1/00; G03F1/68; G03F1/72; H; H05; H05K; H05K3/00; H05K3/0002; H05K3/02; H05K3/027; H05K3/22; H05K3/225
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
249 words
A method of removing and correcting remaining defects in a photomask comprising the steps of: (a) preparing a photomask comprising a transparent glass substrate, a desired circuit pattern of a thin metal film deposited on one surface thereof and having at least one defective portion of the thin metal film existing on said substrate apart from said circuit pattern after forming said circuit pattern: (b) positioning the defective portion of the photomask in a scanning area of a pulsed laser beam; (c) irradiating a pulsed laser beam onto an inner surface of the defective portion of the thin metal film which contacts said substrate through the transparent glass substrate, said laser beam being focussed to provide a beam spot not greater than 5 μm in diameter; (d) relatively scanning the pulsed laser beam with respect to said photomask in two-dimensional directions so as to scan over said defective portion of the photomask; (e) controlling the oscillation frequency of the pulsed laser beam as well as the scanning speed of the laser beam on the defective portion of the thin metal film, and providing beam spots of said laser beam partially superimposed with a super position number in the range of from 1.2 to 15; and (f) removing the defective portion of the thin film while maintaining roughness and pit depths of the processed surface portion underlying the removed thin film portion to less than λ/4, where λ is the wavelength of light for exposure through the photomask in use.
Claim 2
Independent Claim
249 words
A method of removing and correcting remaining defects in a photomask comprising the steps of: (a) preparing a photomask comprising a transparent glass substrate, a desired circuit pattern of a thin metal film deposited on one surface thereof and having at least one defective portion of the thin metal film existing on said substrate apart from said circuit pattern after forming said circuit pattern: (b) positioning the defective portion of the photomask in a scanning area of a pulsed laser beam; (c) irradiating a pulsed laser beam onto an inner surface of the defective portion of the thin metal film which contacts said substrate through the transparent glass substrate, said laser beam being focussed to provide a beam spot not greater than 5 μm in diameter; (d) relatively scanning the pulsed laser beam with respect to said photomask in two-dimensional directions so as to scan over said defective portion of the photomask; (e) controlling the oscillation frequency of the pulsed laser beam as well as the scanning speed of the laser beam on the defective portion of the thin metal film, and providing beam spots of said laser beam partially superimposed with a super position number in the range of from 1.2 to 15; and (f) removing the defective portion of the thin film while maintaining roughness and pit depths of the processed surface portion underlying the removed thin film portion to less than λ/4, where λ is the wavelength of light for exposure through the photomask in use.
Claim 3
Independent Claim
275 words
A method of removing and correcting remaining defects in a photomask comprising the steps of: (a) preparing a photomask comprising a transparent glass substrate, a desired circuit pattern of a thin metal film deposited on one surface thereof and having at least one defective portion of the thin metal film existing on said substrate apart from said circuit pattern after forming said circuit pattern; (b) positioning the defective portion of the photomask in a scanning area of a pulsed laser beam; (c) irradiating onto an inner surface of the defective portion of the thin metal film which contacts said substrate through the transparent glass substrate, a pulsed laser beam having a pulse width not greater than 20 nanoseconds and a peak power density in the range of from 2×10 8 to 8×10 8 watts/cm 2 , said laser beam being focussed to provide a beam spot not greater than 5 μm in diameter; (d) relatively scanning the pulsed laser beam with respect to said photomask in two-dimensional directions so as to scan over said defective portion of the photomask; (e) controlling the oscillation frequency of the pulsed laser beam as well as the scanning speed of the laser beam on the defective portion of the thin metal film, and providing beam spots of said laser beam partially superimposed with a super position number in the range from 1.2 to 15; and (f) removing the defective portion of the thin film while maintaining roughness and pit depths of the processed surface portion underlying the removed thin film portion to less than λ/4, where λ is the wavelength of light for exposure through the photomask in use.
Claim 4
Independent Claim
275 words
A method of removing and correcting remaining defects in a photomask comprising the steps of: (a) preparing a photomask comprising a transparent glass substrate, a desired circuit pattern of a thin metal film deposited on one surface thereof and having at least one defective portion of the thin metal film existing on said substrate apart from said circuit pattern after forming said circuit pattern; (b) positioning the defective portion of the photomask in a scanning area of a pulsed laser beam; (c) irradiating onto an inner surface of the defective portion of the thin metal film which contacts said substrate through the transparent glass substrate, a pulsed laser beam having a pulse width not greater than 20 nanoseconds and a peak power density in the range of from 2×10 8 to 8×10 8 watts/cm 2 , said laser beam being focussed to provide a beam spot not greater than 5 μm in diameter; (d) relatively scanning the pulsed laser beam with respect to said photomask in two-dimensional directions so as to scan over said defective portion of the photomask; (e) controlling the oscillation frequency of the pulsed laser beam as well as the scanning speed of the laser beam on the defective portion of the thin metal film, and providing beam spots of said laser beam partially superimposed with a super position number in the range from 1.2 to 15; and (f) removing the defective portion of the thin film while maintaining roughness and pit depths of the processed surface portion underlying the removed thin film portion to less than λ/4, where λ is the wavelength of light for exposure through the photomask in use.
Claim 5
Dependent Claim
16 words
A method according to claim 2, in which said laser beam is an Ar laser beam.
Claim 6
Dependent Claim
16 words
A method according to claim 2, in which said thin metal film is formed of chromium.
Claim 7
Dependent Claim
18 words
A method according to claim 4, in which said chromium thin film is sandwiched between chromium oxide films.
Claim 8
Dependent Claim
178 words
In a method of processing a photomask by removing defects of a thin metal film disposed on a transparent glass substrate with a pulsed laser beam, said defects remaining on said substrate after forming a circuit pattern of said thin metal film on said substrate, the improvement comprising maintaining roughness and pit depths of the surface of said glass substrate less than λ/4, where λ is the wavelength of exposure light though the photomask, by the steps of aligning the defects of the thin metal film in a scanning area of laser beam spots; irradiating said defects through said transparent substrate with said laser beam spots focussed in diameter to not more than 5 μm; maintaining a pulse width of said laser beam at not more than 20 nanoseconds and a peak power density thereof at from 2×10 8 to 8×10 8 watts/cm 2 ; and scanning said laser beam spots relative to said photomask to superpose irradiated spots of said defects by said laser beam at a superposition number ranging from 1.2 to 15 in two dimensions.
Claim 9
Dependent Claim
178 words
In a method of processing a photomask by removing defects of a thin metal film disposed on a transparent glass substrate with a pulsed laser beam, said defects remaining on said substrate after forming a circuit pattern of said thin metal film on said substrate, the improvement comprising maintaining roughness and pit depths of the surface of said glass substrate less than λ/4, where λ is the wavelength of exposure light though the photomask, by the steps of aligning the defects of the thin metal film in a scanning area of laser beam spots; irradiating said defects through said transparent substrate with said laser beam spots focussed in diameter to not more than 5 μm; maintaining a pulse width of said laser beam at not more than 20 nanoseconds and a peak power density thereof at from 2×10 8 to 8×10 8 watts/cm 2 ; and scanning said laser beam spots relative to said photomask to superpose irradiated spots of said defects by said laser beam at a superposition number ranging from 1.2 to 15 in two dimensions.
Claim 10
Dependent Claim
16 words
A method according to claim 6, in which said laser beam is an Ar laser beam.
Claim 11
Dependent Claim
16 words
A method according to claim 6, in which said thin metal film is formed of chromium.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1983-02-25 | 1983-08-27 | 1984-02-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1987-02-25 | 1987-08-27 | 1988-02-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1991-02-25 | 1991-08-27 | 1992-02-26 | $7700.00 | Window Closed / Lapsed |