Detachable high-speed optoelectronic sampling head

Claim 2

A high-speed optoelectronic sampling head comprising a detachable housing for use with a photo amplifying device, said housing defining an evacuated chamber, a photoemissive strip fixedly mounted in said chamber, a ground plane fixedly mounted in said chamber spaced from said photoemissive strip and defining a microstrip ground plane for said photoemissive strip, feedthrough means extending through a wall of said housing for propagating a high-speed sampling potential difference between said photoemissive strip and said ground plane, a phosphor layer in said chamber positioned to receive photoelectrons emitted from said photoemissive strip, said housing having a first window positioned to direct light to be detected to said photoemissive strip, and a second window transparent to phosphorescent light from said phosphor layer for directing said phosphorescent light from said chamber externally of said housing.

Claim 3

The high-speed optoelectronic sampling head of claim 1, wherein said housing comprises an opaque member having a hole extending therethrough between first and second parallel end faces and defining the walls of said chamber, said first and second windows comprising transparent light sealed over the end faces of said opaque member, and wherein said phosphor layer comprises a phosphor layer on said second window in said chamber.

Claim 4

The high-speed optoelectronic sampling head of claim 2, wherein said windows are of glass and said opaque member is of stainless steel.

Claim 5

The high-speed optoelectronic sampling head of claim 1, wherein said feedthrough means comprises adapter means fitted in the side walls of said housing and extending into said chamber, said ground plane being mounted on said adapter means in said housing, said adapter means defining holes communicating between said chamber and the outside of said housing, and means extending through said adapter means for electrically connecting said photoemissive strip externally of said housing.

Claim 6

A high-speed optoelectronic sampling head comprising a detachable housing for use with a photo amplifying device, said housing member having a hole extending between first and second faces, a transparent window at each end of said hole sealed to said housing, for defining an evacuated chamber in said housing, first and second mounting holes aligned with each other and extending through opposite sides of said housing normal to the axis of said first-mentioned hole, adapter means sealed in said mounting holes and extending into said chamber, a microstrip ground plane mounted on said adapter means in said chamber, means mounting a photoemissive strip adjacent said ground plane in said chamber, whereby said photoemissive strip comprises a microstrip, said microstrip being positioned to receive light to be detected from said first window, means propagating an electropotential between said photoemissive strip and said ground plane, a phosphor layer on said second window in said chamber, said photoemissive strip being positioned to direct photoelectrons emitted therefrom through said ground plane to said phosphor layer.

Claim 7

A high-speed optoelectronic sampling head comprising a detachable housing for use with a photo amplifying device, said housing member having a hole extending between first and second faces, a transparent window at each end of said hole sealed to said housing, for defining an evacuated chamber in said housing, first and second mounting holes aligned with each other and extending through opposite sides of said housing normal to the axis of said first-mentioned hole, adapter means sealed in said mounting holes and extending into said chamber, a microstrip ground plane mounted on said adapter means in said chamber, means mounting a photoemissive strip adjacent said ground plane in said chamber, whereby said photoemissive strip comprises a microstrip, said microstrip being positioned to receive light to be detected from said first window, means propagating an electropotential between said photoemissive strip and said ground plane, a phosphor layer on said second window in said chamber, said photoemissive strip being positioned to direct photoelectrons emitted therefrom through said ground plane to said phosphor layer.

Claim 8

The high-speed optoelectronic sampling head of claim 5, wherein said ground plane comprises a metallic mesh.

Claim 9

The optoelectronic sampling head of claim 5, comprising a mounting plate mounted on said adapter means, said ground plane comprising a metallic mesh stretched on said mounting plate, said mounting plate having an aperture extending therethrough, said photoemissive strip being positioned to direct photoelectrons emitted therefrom through said mesh and aperture in that order to said phosphor layer.

Claim 10

A high-speed optoelectronic sampling head comprising a detachable housing for use with a photo amplifying device, said housing defining an evacuated chamber having first and second transparent windows, a conductive mesh supported in said chamber, a photoemissive strip positioned in said chamber spaced from said mesh whereby light to be detected passes through said first window and falls upon said photoemissive strip to result in the production of photoelectrons, a phosphor layer on said second window in said chamber, said phosphor layer positioned to receive photoelectrons from said photoemissive strip passing through said mesh, and high-frequency insulating means in the wall of said housing for applying sampling potential between said photoemissive strip and said mesh, said photoemissive strip comprising a microstrip and said mesh comprising a ground plane for said microstrip, whereby said sampling potential propagates between said photoemissive strip and mesh.

Claim 11

A high-speed optoelectronic sampling head comprising a detachable housing for use with a photo amplifying device, said housing defining an evacuated chamber having first and second transparent windows, a conductive mesh supported in said chamber, a photoemissive strip positioned in said chamber spaced from said mesh whereby light to be detected passes through said first window and falls upon said photoemissive strip to result in the production of photoelectrons, a phosphor layer on said second window in said chamber, said phosphor layer positioned to receive photoelectrons from said photoemissive strip passing through said mesh, and high-frequency insulating means in the wall of said housing for applying sampling potential between said photoemissive strip and said mesh, said photoemissive strip comprising a microstrip and said mesh comprising a ground plane for said microstrip, whereby said sampling potential propagates between said photoemissive strip and mesh.

Claim 12

The high-speed optoelectronic sampling head of claim 8, comprising a conductive mounting plate for said mesh, said mounting plate having an aperture extending therethrough, said mesh being stretched on said mounting plate over said aperture.

Claim 13

The high-speed optoelectronic sampling head of claim 9, comprising conductive adapter means affixed in a wall of said housing for supporting said support plate, said adapter means having hole means extending therethrough, and high-frequency insulating means in said hole means for connecting said photoemissive strip externally of said housing.

Claim 14

The high-speed optoelectronic sampling head of claim 10, comprising a quartz plate mounted to said support plate, said photoemissive strip being supported on said quartz plate.