Patent DE2005112B2 successfully refreshed from Google Patents.
US3770351A
Expired / Lapsed
US
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Optical analyzer for microparticles
Assignee: Bayer Corp
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Filing: 1971-11-23
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Granted: 1973-11-06
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Expires: 1991-11-23
Abstract
Abstract There is described a method and apparatus for identifying submicroscopic particles by directing the particles through a highly collimated beam of light and simultaneously measuring the light intensity at a plurality of different angles relative to the point where the particles move through the beam.
Inventors
- 👤 P Wyatt
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 15:35
CPC Classifications
G; G01; G01N; G01N15/00; G01N15/02; G01N15/0205; G01N15/0211
Claims Analysis
Total Claims: 47
Claim 1
Independent Claim
113 words
A microparticle analyzer, comprising: means for providing a narrow, collimated incident beam of radiant energy; means for introducing a microparticle into said beam; means for simultaneously detecting the intensity of radiant energy scattered by said microparticle at more than two offset angular locations about said particle, relative to the direction of said incident beam, sufficient to derive a differential scattering pattern characteristic of the electromagnetic, shape and size properties of said microparticle; and means for registering the values of said intensity of said energy detected at each of said locations to derive said pattern from said registered values of said scattered radiation as a function of angle with respect to said incident beam.
Claim 2
Dependent Claim
113 words
A microparticle analyzer, comprising: means for providing a narrow, collimated incident beam of radiant energy; means for introducing a microparticle into said beam; means for simultaneously detecting the intensity of radiant energy scattered by said microparticle at more than two offset angular locations about said particle, relative to the direction of said incident beam, sufficient to derive a differential scattering pattern characteristic of the electromagnetic, shape and size properties of said microparticle; and means for registering the values of said intensity of said energy detected at each of said locations to derive said pattern from said registered values of said scattered radiation as a function of angle with respect to said incident beam.
Claim 3
Dependent Claim
26 words
The analyzer of claim 1, wherein: said beam-providing means is constructed and arranged to generate said beam as a substantially coherent and monochromatic beam of light.
Claim 4
Dependent Claim
36 words
The anlayzer of claim 1, wherein: said introducing means is constructed and arranged for introducing a plurality of microparticles into said beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 5
Dependent Claim
11 words
The analyzer of claim 1, wherein: said radiant energy is light.
Claim 6
Dependent Claim
61 words
The analyzer of claim 4, wherein: said registering means is constructed and arranged to graphically record a series of traces in coordinate reference systems each having one coordinate representing time, and a second coordinate representing the values of the intensity of the radiant energy detected at a corresponding one of said locations, the first coordinates of said reference systems being time-correlated.
Claim 7
Dependent Claim
36 words
The analyzer of claim 4, wherein: said introducing means is constructed and arranged for introducing a plurality of microparticles into said beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 8
Dependent Claim
27 words
The analyzer of claim 4, wherein: said particle location is predetermined and said detection locations are angularly spaced about a circular locus centered on said predetermined location.
Claim 9
Dependent Claim
27 words
The analyzer of claim 4, wherein: said particle location is predetermined and said detection locations are angularly spaced on a circular locus centered on said predetermined location.
Claim 10
Dependent Claim
10 words
The analyzer of claim 4, wherein: said light is polarized.
Claim 11
Dependent Claim
41 words
The analyzer of claim 4, further comprising: means for digitizing said differential scattering pattern; means for storing said digitized pattern; means for storing a digitized reference pattern; and computer means coupled to said digitizing and storing means for comparing said patterns.
Claim 12
Dependent Claim
19 words
The analyzer of claim 4, wherein: said detecting means includes means for detecting said light at a selected frequency.
Claim 13
Dependent Claim
27 words
The analyzer of claim 4, wherein: said particle location is predetermined and said detection locations are angularly spaced on a circular locus centered on said predetermined location.
Claim 14
Dependent Claim
16 words
The analyzer of claim 4, wherein: said detection means includes means to polarize said scattered light.
Claim 15
Dependent Claim
12 words
The analyzer of claim 1, wherein: said beam-providing means includes a laser.
Claim 16
Dependent Claim
27 words
The analyzer of claim 14, wherein: said particle location is predetermined and said detection locations are angularly spaced on a circular locus centered on said predetermined location.
Claim 17
Independent Claim
139 words
The method of analyzing microparticles, which comprises the steps of: detecting the intensity of radiant energy scattered by a microparticle, located in an incident beam of radiant energy, at more than two offset angular locations about said microparticle, relative to the direction of said incident beam, sufficient to derive a differential scattering pattern characteristic of the electromagnetic, shape and size properties of said microparticle; registering the value of said inteNsity of the radiant energy received at each of said locations; deriving said pattern from said registered values of the scattered radiation as a function of angle with respect to said incident beam; producing an independently derived reference pattern of scattered radiation as a function of angle with respect to an incident beam; and comparing selected characteristics of said registered values pattern and said reference pattern to analyze said microparticles.
Claim 18
Independent Claim
139 words
The method of analyzing microparticles, which comprises the steps of: detecting the intensity of radiant energy scattered by a microparticle, located in an incident beam of radiant energy, at more than two offset angular locations about said microparticle, relative to the direction of said incident beam, sufficient to derive a differential scattering pattern characteristic of the electromagnetic, shape and size properties of said microparticle; registering the value of said inteNsity of the radiant energy received at each of said locations; deriving said pattern from said registered values of the scattered radiation as a function of angle with respect to said incident beam; producing an independently derived reference pattern of scattered radiation as a function of angle with respect to an incident beam; and comparing selected characteristics of said registered values pattern and said reference pattern to analyze said microparticles.
Claim 19
Dependent Claim
11 words
The method of claim 16, wherein: said radiant energy is light.
Claim 20
Dependent Claim
14 words
The method of claim 17, wherein: said pattern is derived from simultaneously registered values.
Claim 21
Dependent Claim
13 words
The method of claim 17, wherein: said detecting at said locations is simultaneous.
Claim 22
Dependent Claim
14 words
The method of claim 17, wherein: said beam is narrow, collimated, coherent and monochromatic.
Claim 23
Dependent Claim
11 words
The method of claim 17, wherein: said incident light is polarized.
Claim 24
Dependent Claim
24 words
The method of claim 21, wherein: the first said pattern is derived from simultaneously derived values; and said detecting at said locations is simultaneous.
Claim 25
Dependent Claim
115 words
The method of claim 22, wherein: said independently derived reference pattern is obtained by detecting the intensity of radiant energy scattered by a second microparticle, located in an incident beam of radiant energy, at more than two offset angular locations about said second microparticle, relative to the direction of said incident beam, sufficient to derive a differential scattering pattern characteristic of the electromagnetic, shape and size properties of said second microparticle; registering the value of said intensity of the radiant energy received from said second microparticle at each of said locations; and deriving said reference pattern from said registered values of the scattered radiation as a function of angle with respect to said incident beam.
Claim 26
Dependent Claim
29 words
The method of claim 23, wherein: a plurality of microparticles is introduced into the beam at a predetermined location and said radiaton is scattered from said plurality of microparticles.
Claim 27
Dependent Claim
36 words
The method of claim 22, wherein: said differential scattering pattern is digitized and stored in a computer; said reference pattern is digitized and stored in said computer; and said comparison step is performed in said computer.
Claim 28
Dependent Claim
11 words
The method of claim 25, wherein: said scattered light is polarized.
Claim 29
Dependent Claim
29 words
The method of claim 25, wherein: a plurality of microparticles is introudced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 30
Dependent Claim
11 words
The method of claim 25, wherein: said incident light is polarized.
Claim 31
Dependent Claim
29 words
The method of claim 28, wherein: a plurality of microparticles is introduced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 32
Dependent Claim
29 words
The method of claim 22, wherein: a plurality of microparticles is introduced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 33
Dependent Claim
115 words
The method of claim 17, wherein: said independently derived reference pattern is obtained by detecting the intensity of radiant energy scattered by a second microparticle, located in an incident beam of radiant energy, at more than two offset angular locations about said second microparticle, relative to the direction of said incident beam, sufficient to derive a differential scattering pattern characteristic of the electromagnetic, shape and size properties of said second microparticle; registering the value of said intensity of the radiant energy received from said second microparticle at each of said locations; and deriving said reference pattern from said registered values of the scattered radiation as a function of angle with respect to said incident beam.
Claim 34
Dependent Claim
29 words
The method of claim 31, wherein: a plurality of microparticles is introduced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 35
Dependent Claim
36 words
The method of claim 17, wherein: said differential scattering pattern is digitized and stored in a computer; said reference pattern is digitized and stored in said computer; and said comparison step is performed in said computer.
Claim 36
Dependent Claim
29 words
The method of claim 33, wherein: a plurality of microparticles is introduced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 37
Dependent Claim
42 words
The method of claim 17, wherein: the first said pattern is derived from simultaneously registered values; said detecting at said locations is simultaneous; said differential scattering pattern is digitized and stored in a computer; said comparison step is performed in said computer.
Claim 38
Dependent Claim
29 words
The method of claim 35, wherein: a plurality of microparticles is introduced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 39
Dependent Claim
132 words
The method of claim 17, wherein: the first said pattern is derived from simultaneously registered values; said detecting at said locations is simultaneous; said independently derived reference pattern is obtained by detecting the intensity of radiant energy scattered by a second microparticle, located in an incident beam of radiant energy, at more than two offset angular locations about said second microparticle, relative to the direction of said incident beam, sufficient to derive a differential scattering pattern characteristic of the electromagnetic, shape and size properties of said second microparticle; registering the value of said intensity of the radiant energy received from said second microparticle at each of said locations; and deriving said reference pattern from said registered values of the scattered radiation as a function of angle with respect to said incident beam.
Claim 40
Dependent Claim
36 words
The method of claim 37, wherein: said differential scattering pattern is digitized and stored in a computer; said reference pattern is digitized and stored in said computer; and said comparison step is performed in said computer.
Claim 41
Dependent Claim
29 words
The method of claim 38, wherein: a plurality of microparticles is introduced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 42
Dependent Claim
29 words
The method of claim 37, wherein: a plurality of microparticles is introduced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 43
Dependent Claim
29 words
The method of claim 17, wherein: a plurality of microparticles is introudced into the beam at a predetermined location and said radiation is scattered from said plurality of microparticles.
Claim 44
Dependent Claim
26 words
The method of claim 17, wherein: said particle is predetermined and said detection locations are angularly spaced on a circular locus centered on said predetermined location.
Claim 45
Dependent Claim
26 words
The method of claim 17, wherein: said particle location is predetermined and said locations are angularly spaced on a spherical locus centered on said predetermined location.
Claim 46
Dependent Claim
14 words
The method of claim 17, wherein: said light is detected at a selected frequency.
Claim 47
Dependent Claim
11 words
The method of claim 17, wherein: said scattered light is polarized.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1976-11-05 | 1977-05-07 | 1977-11-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1980-11-05 | 1981-05-07 | 1981-11-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1984-11-05 | 1985-05-07 | 1985-11-06 | $7700.00 | Window Closed / Lapsed |