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US3675019A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus for measuring the amount of a substance that is associated with a base material

Assignee: Honeywell Measurex Corp
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Filing: 1971-03-19
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Granted: 1972-07-04
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Expires: 1991-03-19
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Abstract

Abstract A moisture gauge for paper material includes an infrared source and two detectors one of which is responsive to a wavelength of 1.94 microns which is sensitive to moisture in the paper; the other detector is responsive to 1.8 microns which is not affected by moisture. The operating point of the detector not sensitive to moisture is maintained constant by a feedback system. At the same time an impedance ratio of the two detectors provides information as to absolute moisture content. Automatic standardization of the system is also provided.

Inventors

  • 👤 Robert C Hill
  • 👤 John M French
  • 👤 Richard E Toepfer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 12:41
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/25; G01N21/31; G01N21/314; G01N33/00; G01N33/34; G01N33/346

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 210 words
In apparatus for measuring the amount of substance that is associated with a material said apparatus including a radiation source that emits a first spectral band of radiation that impinges on the material but lies outside of an absorption band of the substance and that emits a second spectral band that lies within a resonant absorption band of the substance, detector means responsive to the intensities of said spectral bands which are reflected from or transmitted through said material to produce an electric signal proportional to the amount of substance which is present, said detector means including a first detector responsive to said first spectral band and a second detector responsive to said second spectral band, beam splitting means for directing radiation from said radiation source to said first and second detectors, automatic standardization means comprising means juxtaposed between said radiation source and said beam splitting means for simulating said material in a condition having substantially none or a known amount of said substance, means for juxtaposing between one of said detectors and said beam splitting means attenuation means simulating at least one known amount of said substance to be measured, and means for normalizing to a standard value said electrical output signal caused by said known amount of substance.
Claim 2
Dependent Claim 210 words
In apparatus for measuring the amount of substance that is associated with a material said apparatus including a radiation source that emits a first spectral band of radiation that impinges on the material but lies outside of an absorption band of the substance and that emits a second spectral band that lies within a resonant absorption band of the substance, detector means responsive to the intensities of said spectral bands which are reflected from or transmitted through said material to produce an electric signal proportional to the amount of substance which is present, said detector means including a first detector responsive to said first spectral band and a second detector responsive to said second spectral band, beam splitting means for directing radiation from said radiation source to said first and second detectors, automatic standardization means comprising means juxtaposed between said radiation source and said beam splitting means for simulating said material in a condition having substantially none or a known amount of said substance, means for juxtaposing between one of said detectors and said beam splitting means attenuation means simulating at least one known amount of said substance to be measured, and means for normalizing to a standard value said electrical output signal caused by said known amount of substance.

References Cited (Backward Citations)

US3228282A Cited
US3363101A Cited
US3478210A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1975-07-04 1976-01-03 1976-07-04 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1979-07-04 1980-01-03 1980-07-04 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1983-07-04 1984-01-03 1984-07-04 $7700.00 Window Closed / Lapsed

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