US3629782A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Resistor with means for decreasing current density
Assignee: Cogar Corp
•
Filing: 1970-10-06
•
Granted: 1971-12-21
•
Expires: 1990-10-06
Abstract
Abstract Semiconductor and cermet or thin film resistors employ thin film contacts of aluminum and the like. Failure of these resistors at the positive terminal due to electromigration is virtually eliminated by special designs for decreasing current density at the positive end of the resistor. The width of the resistor at its positive end, and its associated contact is made larger than at the negative end. With semiconductor resistors, a more heavily doped diffusion is used at the positive end.
Inventors
- 👤 Ravinder J Sahni
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 07:00
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/40; H10D1/43; H01; H01C; H01C7/00; H10D99/00
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
77 words
A semiconductor resistor with improved reliability comprising: semiconductive material with a region of first conductivity type; a second region within said first region of second conductivity type forming a resistance; said second region having a positive and a negative end; the positive end of said second region being larger in width than the negative end; and, terminal means connected to the positive and negative ends of said second region corresponding in width to their said respective ends.
Claim 2
Dependent Claim
77 words
A semiconductor resistor with improved reliability comprising: semiconductive material with a region of first conductivity type; a second region within said first region of second conductivity type forming a resistance; said second region having a positive and a negative end; the positive end of said second region being larger in width than the negative end; and, terminal means connected to the positive and negative ends of said second region corresponding in width to their said respective ends.
Claim 3
Dependent Claim
65 words
A semiconductor resistor with improved reliability comprising: a semiconductive material with a region of first conductivity type; a resistance region of second conductivity type formed within said first region and having a positive and negative end; said second region being more heavily doped at said positive end than said negative end; and, terminal means connected to the positive and negative ends of said resistance region.
Claim 4
Dependent Claim
65 words
A semiconductor resistor with improved reliability comprising: a semiconductive material with a region of first conductivity type; a resistance region of second conductivity type formed within said first region and having a positive and negative end; said second region being more heavily doped at said positive end than said negative end; and, terminal means connected to the positive and negative ends of said resistance region.
Claim 5
Dependent Claim
76 words
A resistor with reduced susceptibility to failure due to electromigration comprising: a resistive element having a positive and negative end; terminal means connected to the positive and negative ends of said element; and, means for decreasing current density at the positive end of said resistor, said positive end of said resistive element and its associated terminal is large in width compared to the width of the negative end of said resistive element and its associated terminal.
Claim 6
Dependent Claim
76 words
A resistor with reduced susceptibility to failure due to electromigration comprising: a resistive element having a positive and negative end; terminal means connected to the positive and negative ends of said element; and, means for decreasing current density at the positive end of said resistor, said positive end of said resistive element and its associated terminal is large in width compared to the width of the negative end of said resistive element and its associated terminal.
Claim 7
Dependent Claim
75 words
A resistor with reduced susceptibility to failure due to electromigration comprising: a resistive element having a positive and negative end; terminal means connected to the positive and negative ends of said element; means for decreasing current density at the positive end of said resistor; and, including a substrate of semiconductive material with a region of a first conductivity type, and said resistive element comprises a second region within said first region of opposite conductivity type.
Claim 8
Dependent Claim
75 words
A resistor with reduced susceptibility to failure due to electromigration comprising: a resistive element having a positive and negative end; terminal means connected to the positive and negative ends of said element; means for decreasing current density at the positive end of said resistor; and, including a substrate of semiconductive material with a region of a first conductivity type, and said resistive element comprises a second region within said first region of opposite conductivity type.
Claim 9
Dependent Claim
42 words
The invention defined by claim 4 wherein the positive end of said second region of opposite conductivity type and its associated terminal is large in width compared to the width of the negative end of said second region and its associated terminal.
Claim 10
Dependent Claim
26 words
The invention defined by claim 5 wherein the positive end of said second region is more heavily doped than the negative end of said second region.
Claim 11
Dependent Claim
17 words
The invention defined by claim 4 wherein said positive terminal means is a thin film of metal.
Claim 12
Dependent Claim
11 words
The invention defined by claim 7 wherein said metal is aluminum.
Claim 13
Dependent Claim
94 words
A resistor with reduced susceptibility to failure due to electromigration comprising: a resistive element having a positive and negative end; terminal means connected to the positive and negative ends of said element; means for decreasing current density at the positive end of said resistor; and including a substrate and said resistive element is cermet material deposited on the surface of said substrate, the positive end of said cermet resistive element and its associated terminal is large in width compared to the width of the negative end of said resistive element and its associated terminal.
Claim 14
Dependent Claim
94 words
A resistor with reduced susceptibility to failure due to electromigration comprising: a resistive element having a positive and negative end; terminal means connected to the positive and negative ends of said element; means for decreasing current density at the positive end of said resistor; and including a substrate and said resistive element is cermet material deposited on the surface of said substrate, the positive end of said cermet resistive element and its associated terminal is large in width compared to the width of the negative end of said resistive element and its associated terminal.
Claim 15
Dependent Claim
68 words
A resistor with reduced susceptibility to failure due to electromigration comprising a resistive element having a positive and negative end; terminal means connected to the positive and negative ends of said element; means for decreasing current density at the positive end of said resistor; and including a substrate anD said resistive element is cermet material deposited on the surface of said substrate, said cermet material is silicon monoxide.
Claim 16
Dependent Claim
68 words
A resistor with reduced susceptibility to failure due to electromigration comprising a resistive element having a positive and negative end; terminal means connected to the positive and negative ends of said element; means for decreasing current density at the positive end of said resistor; and including a substrate anD said resistive element is cermet material deposited on the surface of said substrate, said cermet material is silicon monoxide.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-12-20 | 1975-06-21 | 1975-12-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-12-20 | 1979-06-21 | 1979-12-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-12-20 | 1983-06-21 | 1983-12-21 | $7700.00 | Window Closed / Lapsed |