Computer controlled test system and method

Claim 3

A test method of analog nonrepetitive waveforms which is directed in operation by a programmed digital computer to provide in accordance with stored input data signal measurement of a device having at least one magnetic memory element which produces a response voltage characteristic upon application to said device of analog stimulating drive current pulses which comprises the steps of selecting one of a plurality of pulse sequences in response to said data signals, forming a plurality of analog stimulating drive current pulses each having a predetermined waveform in response to said data signals, applying said stimulating drive current pulses at said selected pulse sequence to said device, receiving said response voltage characteristic from said device and explicitly measuring with respect to the time of the occurrence of a stimulating drive current pulse (1) the response voltage at a time determined by the shape of said response voltage and (2) predetermined time characteristics of said response voltage characteristic, means for generating output reports of said explicit measurements, and selecting a different one of said pulse sequences and forming a different analog stimulating drive current pulse waveform in response to the explicit meAsurements and said input data.

Claim 4

A test method of analog nonrepetitive waveforms which is directed in operation by a programmed digital computer to provide in accordance with stored input data signal measurement of a device having at least one magnetic memory element which produces a response voltage characteristic upon application to said device of analog stimulating drive current pulses which comprises the steps of selecting one of a plurality of pulse sequences in response to said data signals, forming a plurality of analog stimulating drive current pulses each having a predetermined waveform in response to said data signals, applying said stimulating drive current pulses at said selected pulse sequence to said device, receiving said response voltage characteristic from said device and explicitly measuring with respect to the time of the occurrence of a stimulating drive current pulse (1) the response voltage at a time determined by the shape of said response voltage and (2) predetermined time characteristics of said response voltage characteristic, means for generating output reports of said explicit measurements, and selecting a different one of said pulse sequences and forming a different analog stimulating drive current pulse waveform in response to the explicit meAsurements and said input data.

Claim 5

The test method of claim 2 in which there is provided in said receiving and measuring step the measurement of the peak voltage Ap and the time duration tp.

Claim 6

The test method of claim 2 in which there is provided the further step of comparing said explicit measurements with high and low acceptance levels.

Claim 7

The test method of claim 4 in which there is provided the further steps of recording the instances of error which occur when the explicit measurements do not meet the acceptance levels and maintaining said error recording for the duration of a test and reading out said error recording in said output reports.

Claim 8

The test method of claim 2 in which there is provided the further step of repeating the identical test of a device after explicitly measuring said response voltage characteristics.

Claim 9

The test method of claim 2 in which there is provided the further step of storing new test data signals relating to said pulse sequences and predetermined waveform and reading said new test data signals prior to beginning said selecting step.

Claim 10

The test method of claim 2 in which there is provided in said receiving and measuring step, the measurement of the time duration of ts.

Claim 11

A test method directed in operation by a programmed digital computer for testing analog nonrepetitive waveforms to provide in accordance with stored data signals measurement of a device which produces an analog response voltage characteristic upon application to said device of an analog stimulating signal comprising the steps of selecting one of a plurality of signal sequences in accordance with said data signals, forming a plurality of analog stimulating drive signals each having a predetermined waveform in accordance with said data signals, applying said plurality of analog stimulating signals to said device at said selected signal sequence, receiving a response voltage characteristic of said device and providing analog explicit measurements of (1) the response voltage at a time determined by the shape of said response voltage characteristic and (2) selected time characteristics of said response voltage characteristic, and generating output reports of said analog explicit measurements.

Claim 12

A test method directed in operation by a programmed digital computer for testing analog nonrepetitive waveforms to provide in accordance with stored data signals measurement of a device which produces an analog response voltage characteristic upon application to said device of an analog stimulating signal comprising the steps of selecting one of a plurality of signal sequences in accordance with said data signals, forming a plurality of analog stimulating drive signals each having a predetermined waveform in accordance with said data signals, applying said plurality of analog stimulating signals to said device at said selected signal sequence, receiving a response voltage characteristic of said device and providing analog explicit measurements of (1) the response voltage at a time determined by the shape of said response voltage characteristic and (2) selected time characteristics of said response voltage characteristic, and generating output reports of said analog explicit measurements.