Circuit tester providing circuit-selected test parameters
Abstract
Abstract THIS APPLICATION DISCLOSES A CIRCUIT TESTER PARTICULARLY USEFUL FOR DIGITAL INTEGRATED CIRCUITS AND COMPRISING A CHASSIS, ONE OR MORE FAMILY LIMIT CARDS, AND ONE OR MORE DEVICE TEST CARDS. THE FAMILY LIMIT CARDS ARE EACH ADAPTED TO BE DETACHABLY CONNECTED TO THE CHASSIS, AND EACH INCLUDES COMPONENTS SELECTED TO ADAPT THE APPARATUS TO TEST ONE OF A FAMILY CIRCUITS. THE DEVICE TEST CARDS ARE EACH ADAPTED TO BE CONNECTED TO THE CHASSIS AND TO A PARTICULAR CIRCUIT TO BE TESTED, AND EACH INCLUDES COMPONENTS SELECTED TO ADAPT THE APPARATUS TO TEST THE PARTICULAR CIRCUIT. MEANS ARE PROVIDED FOR SUBJECTING THE CIRCUIT UNDER TEST TO A SET OF ANALOG TESTS FOR EACH OF A FULL SET OF DIGITAL INPUT SIGNALS, AND INDICATING IMPROPER RESPONSES TO THOSE TESTS. THE FULL SPECIFICATION SHOULD BE CONSULTED FOR AN UNDERSTANDING OF THE INVENTION.
Inventors
- 👤 Nicholas De Wolf
Bibliographic Details
Claims Analysis
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-02-08 | 1974-08-10 | 1975-02-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-02-08 | 1978-08-10 | 1979-02-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-02-08 | 1982-08-10 | 1983-02-09 | $7700.00 | Window Closed / Lapsed |