US3427462A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Defect detector which simultaneously views a large and small area of the sample
Assignee: EIDP Inc
•
Filing: 1966-08-05
•
Granted: 1969-02-11
•
Expires: 1986-08-05
Abstract
No abstract record available.
Inventors
- 👤 John David Cist
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 11:44
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88; G01N21/89
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US3114791A
Cited
US3257563A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-02-11 | 1972-08-12 | 1973-02-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-02-11 | 1976-08-12 | 1977-02-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-02-11 | 1980-08-12 | 1981-02-11 | $7700.00 | Window Closed / Lapsed |