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US3423677A Expired / Lapsed US ⏱️ 0.0 years remaining

Test system for automatically making static and dynamic tests on an electronic device

Assignee: Texas Instruments Inc
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Filing: 1965-12-07
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Granted: 1969-01-21
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Expires: 1985-12-07
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Abstract

No abstract record available.

Inventors

  • 👤 John H Alford
  • 👤 Harold A Armand
  • 👤 William E Bray
  • 👤 Edward E Hamilton
  • 👤 Leslie L Jasper
  • 👤 Samuel D Moore
  • 👤 Robert L Renker
  • 👤 Richard M Ryon Jr

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-22 19:42
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31917

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

US3219927A Cited
US3082374A Cited
US3116448A Cited
US3287636A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1972-01-21 1972-07-22 1973-01-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1976-01-21 1976-07-22 1977-01-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1980-01-21 1980-07-22 1981-01-21 $7700.00 Window Closed / Lapsed

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