US3237104A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Pass or fail transistor tester for indicating the combined result of bvceo and spurious oscillation tests
Assignee: Lorain Products Corp
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Filing: 1962-03-05
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Granted: 1966-02-22
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Expires: 1982-03-05
Abstract
No abstract record available.
Inventors
- 👤 Stephen L Merkel
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 18:25
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2608
Claims Analysis
Total Claims: 1
Claim 1
Independent Claim
103 words
IN A TRANSISTOR TESTER OF THE TYPE ADAPTED TO MEASURE D.-C. PULSES FORMED BY A TRANSISTOR TO BE TESTED, IN COMBINATION, A PULSATING D.-C. SOURCE, A METERING CIRCUIT SECTION AND A TEST CIRCUIT SECTION, SAID TEST CIRCUIT SECTION INCLUDING THE TRANSISTOR TO BE TESTED, INDUCTIVE MEANS SERIALLY CONNECTED WITH THE EMITTER-COLLECTOR CIRCUIT OF SAID TRANSISTOR ACROSS SAID PULSATING D.-C. SOURCE, A TIMING CIRCUIT INCLUDING FIRST CAPACITIVE MEANS AND RESISTIVE MEANS, MEANS FOR CONNECTING THE BASE OF SAID TRANSISTOR AND ONE OTHER ELECTRODE THEREOF ACROSS SAID D.-C. SOURCE THROUGH SAID RESISTIVE MEANS, MEANS FOR CONNECTING SAID CAPACITIVE MEANS ACROSS SAID D.-C. SOURCE THROUGH SAID
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1969-02-21 | 1969-08-23 | 1970-02-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1973-02-21 | 1973-08-23 | 1974-02-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1977-02-21 | 1977-08-23 | 1978-02-22 | $7700.00 | Window Closed / Lapsed |