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JPS5639433A Expired / Lapsed JP ⏱️ 0.0 years remaining

Method for measuring temperature pattern and its apparatus

Assignee: SIGMA DENSHI KOGYO KK
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Filing: 1979-09-05
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Granted: —
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Expires: 1999-09-05
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Abstract

Abstract PURPOSE:To make possible a highly accurate and high resolving power measurement without being affected by a surrounding atmosphere by performing a two-color temperature operation per each area of a photographed picture through a filter consisted of a combination of two kinds of optical filter segments which can be allowed to transmit different wave components. CONSTITUTION:A filter 2 is made by combining optical filter segments, 21 and 22, which can transmit two kinds of wave length components respectively so that both may be adjacent to each other. A picture signal in the photograph apparatus 1 in accordance with an optical wave length from a measuring object W through the filter 2 is subjected to a two-color temperature operation by a arithmetic unit scanning the picture in an area formed by a set of the segment together with being stored in a memory 5 with a video signal treatment apparatus 4. As a result of the operation corresponding to each area of them, a temperature pattern having a combination of two-color thermometer and picture processing is determined, whereby it is possible to measure a temperature pattern having a high accuracy and a high resolving power without being affected by a surrounding atmosphere for an electric seam welded steel pipe or the like working in the humid or dusty atmosphere.

Inventors

  • 👤 Masao Tatsuwaki
  • 👤 Arata Nemoto
  • 👤 Seiichi Okuhara

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-23 15:31
CPC Classifications
G; G01; G01J; G01J5/00; G01J5/60

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