JP3201368B2
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Semiconductor integrated circuit and test method therefor
Assignee: NEC Corp
•
Filing: 1999-01-18
•
Granted: 2001-08-20
•
Expires: 2019-01-18
Abstract
No abstract record available.
Inventors
- 👤 潤 伊藤
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-10-23 20:01
CPC Classifications
A; A61; A61B; A61B17/00; A61B2017/0046; A61B2017/00473
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
Maintenance schedule is calculated for granted US utility patents.