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EP0073303A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Process for forming a patterned mask using a positive electron beam resist

Assignee: International Business Machines Corp
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Filing: 1982-06-08
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Granted: —
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Expires: 2002-06-08
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Abstract

Abstract A positive working electron beam resist comprising a resinous condensation product of formaldehyde with a phenol or a cresol having a chloro substituent ortho to the hydroxyl group on its aromatic ring is imagewise exposed to electron beam irradiation and then the exposed portion of the resist is dissolved away to leave a petterned mask.

Inventors

  • 👤 James Economy
  • 👤 Roy John Gritter
  • 👤 Hiroyuki Hiraoka

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-23 07:01
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/039

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 65 words
A process for forming a patterned mask by the steps of imagewise exposing a positive-acting resist to electron beam irradiation, and selectively removing the exposed portion of the resist by treating it with a solvent, characterised in that the resist comprises a condensation product of formaldehyde with a phenol or a cresol having a chloro substituent ortho to the hydroxyl group on its aromatic ring.
Claim 2
Dependent Claim 65 words
A process for forming a patterned mask by the steps of imagewise exposing a positive-acting resist to electron beam irradiation, and selectively removing the exposed portion of the resist by treating it with a solvent, characterised in that the resist comprises a condensation product of formaldehyde with a phenol or a cresol having a chloro substituent ortho to the hydroxyl group on its aromatic ring.
Claim 3
Dependent Claim 33 words
A process as claimed in claim 1, wherein the resist is formed by the condensation of formaldehyde with an ortho-chloro-substituted phenol or cresol in a reaction catalyzed by the presence of oxalic acid.
Claim 4
Dependent Claim 21 words
A process as claimed in claim 1 or claim 2, wherein the resist is a condensation product of formaldehyde with ortho-chloro-phenol.

References Cited (Backward Citations)

US4123279A Cited

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